Search results for "advantest"
SiP device tester to feature at SEMICON China
Products and services in demand by the Chinese semiconductor market will be showcased by Advantest at SEMICON China in Shanghai (March 14-16). Among the emerging test solutions on display will be the T2000 AiR system, designed for testing modules and system-in-package (SiP) devices that integrate MCUs and application processors to perform functions such as telecommunications, power management and sensing.
5G mmWave test system makes debut at MWC 2018
A 5G test solution that enables both the network and the device ecosystems to emulate end-to-end use cases to meet interoperability requirements and gain insights into overall system behaviour will be showcased by W2BI, an Advantest Group company at Mobile World Congress in Barcelona (February 26 - March 1).
Advanced IC test solutions set for SEMICON Korea
Leading semiconductor test equipment supplier Advantest will present its innovative test solutions at SEMICON Korea in Seoul (January 31-February 2). Additionally, Advantest is a platinum sponsor of SEMICON Korea and the Industry Leadership Dinner, which will take place the evening of January 31.
Rectifier diodes feature low forward voltage drop
The HY Electronic SMA 1A series of rectifier diodes are in stock at JPR Electronics. Seven devices are available with reverse voltages of 50V, 100V, 200V, 400V, 600V, 800V and 1000V, all rated at 1A forward current. The SMA 1 series is based on a glass passivated chip featuring low reverse leakage current and low forward voltage drop.
Early bird discount offered at VOICE 2018 registration
Semiconductor test equipment supplier Advantest has opened registration for its VOICE 2018 Developer Conference. VOICE will return to San Diego, California (May 15-16) and Hsinchu, Taiwan (May 23) under the unifying theme "Measure the Connected World and Everything in It”.
Stimulus test cell accelerates sensor testing
The HA7300 stimulus test cell announced by Advantest is a full capability solution for the testing of differential pressure sensors which are becoming pervasive in modern automobile designs focused on better fuel economy and green technologies. The HA7300 delivers high-speed, highly precise test temperature control with a proprietary technology that utilises a heat or cold plate to control the temperature of the sensors under test.
Enhanced modules aid EV powertrain tests
Semiconductor test equipment supplier Advantest has introduced two modules that enable its T2000 IPS system to test high-voltage and high-power devices used in the power trains of electric vehicles (EV/HV). The enhanced MMXHE (multifunction mixed high voltage) and MFHPE (multifunction floating high power) modules enable massively parallel, high-performance testing by leveraging Advantest’s multifunctional pin design, which allows flexibilit...
Automated handler cuts cost of mobile IC test
The M4171 handler from semiconductor test equipment supplier Advantest has been developed to meet the mobile electronics market’s needs for cost-efficient thermal control testing of ICs with high power dissipation during device characterisation and pre-production bring up.
Automotive test solutions motor into Munich
A line of test solutions for automotive, communications and consumer devices together with metrology and advanced E-beam lithography systems will be showcased by Advantest at SEMICON EUROPA in Munich (14-17 November). Show attendees can learn about Advantest’s latest product developments in semiconductor test.
IC test solutions on parade at productronica
Semiconductor test equipment supplier Advantest will highlight the latest measurement solutions for automotive, communications and consumer devices at productronica in Munich (14-17 November). The company will demonstrate its EVA100 analogue/mixed-signal test solution that combines a modular architecture with high-voltage and high-precision analogue parametric measurement units, providing the flexibility to conduct various measurements over a bro...