Search results for "advantest"
Cloud testing showcased at RADECS 2017
Semiconductor test equipment supplier Advantest will showcase its CloudTesting Services (CTS) at RADECS 2017, the annual European forum for the presentation and discussion of the latest advances in the field of radiation effects on electronic and photonic materials, devices, circuits, sensors, and systems.
VOICE 2018 calls for papers
An international call for papers has been announced by Advantest for the VOICE 2018 Developer Conference focusing on innovative test solutions for system-on-chip (SoC) and memory semiconductor devices, handler solutions, best practices and hot topics. The 2018 conference will return to the 2016 host cities of San Diego, CA and Hsinchu, Taiwan on May 15-16 and on May 23, respectively, under the unifying theme “Measure the Connected World&hel...
EB lithography system takes centre stage at MNE
Semiconductor test equipment supplier Advantest will feature its F7000 EB (electron beam) lithography system and other nanotechnology-ready equipment at the 43rd Micro and Nanoengineering (MNE) show (September 18-22) in Braga, Portugal. The MNE program and exhibition covers current and relevant activities in micro- and nanoengineering.
Test automation platform addresses LTE, GSM and WCDMA
The MLT1600 cloud-enabled, device test automation tester has been unveiled as the newest member of its Micro Line Tester portfolio by W2BI, an Advantest Group company. It is designed to meet the testing challenges of IoT products across multiple cellular radio technologies – such as GSM, WCDMA and LTE – with a 70MHz to 6GHz frequency range.
Advantest selected as Index Component for SNAM Sustainability Index
Semiconductor test equipment supplier Advantest has been selected as an index component of the SNAM Sustainability Index managed by Sompo Japan Nipponkoa Asset Management (SNAM). The SNAM Sustainability Index combines evaluations of ESG (environment, society, and governance) and share prices.
Annual developer conference enters second decade
Semiconductor test equipment supplier, Advantest, held itsVOICE 2017 Developer Conference in May. The 2017 event marked the conference entering its second decade with 113 technical breakout sessions, two Partners’ Expos, 29 technology kiosks and multiple networking opportunities for members of the semiconductor test industry. This year’s 11thedition featured dual sessions on 16th to 17th May in Palm Springs, California, and on 26th Ma...
Test solutions and technical papers on display at SEMICON West
Semiconductor test equipment supplier, Advantest, will showcase its innovative test solutions, present three technical papers and sponsor several activities at the SEMICON West 2017 trade show, taking place 11th to 13th July to Moscone Center in San Francisco. “As a global leader in semiconductor test solutions, we are uniquely positioned to deliver end-to-end solutions for the connected world,” said Judy Davies, Vice President of Glo...
SSD test solutions on parade at Flash Memory Summit
Semiconductor test equipment supplier Advantest will showcase the latest additions to its MPT3000 series of solid-state drive (SSD) test solutions and present two technical papers at this year’s Flash Memory Summit (8-10 August ) at the Santa Clara Convention Centre. Advantest is an emerald sponsor of the 2017 Summit.
Test solutions on parade at SEMICON West
Innovative test solutions, three technical papers and sponsorship of several activities are all on the menu for Advantest at the SEMICON West trade show (July 11-13) in San Francisco. The company will have exhibits on several of its product platforms for testing and measuring all aspects of semiconductor devices.
Memory tester features powerful MRA capability
Optimised for wafer-level testing of DRAMs, NAND devices and other non-volatile memories used throughout portable electronic devices,Advantest has launched the T5822 memory tester, the newest member of its T5800 product series.With mobile applications booming, semiconductor manufacturers need low-cost solutions for high-volume testing of a wide range of price-sensitive memory ICs.