Search results for "advantest"
Advantest to sponsor SEMI High Tech U program
Leading semiconductor test equipment supplier Advantest is partnering with SEMI as one of four corporate sponsors of the first SEMI High Tech U program to be held in conjunction withthe annual SEMICON West exhibition at the Moscone Centre in San Francisco (July 10-12).
Scanning electron microscope features in Grenoble
The E3640Multi Vision Metrology Scanning Electron Microscope (MVM-SEM) will be showcased by Advantest at the upcoming European Mask and Lithography Conference in Grenoble (June 18-20). This advanced tool supports pattern measurement for photomasks and other patterned media at dimensions as small as 1Xnm.
Cloud testing service showcased at Malaysia event
Advanced products and services will be featured by Advantest at SEMICON Southeast Asia in Kuala Lumpur, Malaysia (May 22-24). Advantest is a silver sponsor of SEMICON Southeast Asia. Advantest will showcase its evolutionary EVA100 measurement system, which can be used anywhere from engineering to volume-production environments.
Floating power source extends IC test capabilities
Leading semiconductor test equipment supplier Advantest has extended the performance of its V93000 single scalable platform with the FVI16 floating power VI source for testing power and analogue ICs used in automotive, industrial and consumer mobile-charging applications such as the growing e-mobility and rapid charger market.
Memory tester supports DDR5 and LP-DDR5 devices
Semiconductor test equipment supplier Advantest has introduced its T5503HS2 memory tester, a test solution for the fastest memory devices available today as well as next-generation, super-high-speed DRAMs. The new system’s flexibility extends the capabilities of the T5503 product family in the current “super cycle,” of skyrocketing memory market growth.
ADAS sensor test system tops bill at Detroit show
An innovative test solution for semiconductor-based pressure sensors used in advanced driver-assistance systems (ADAS) will be presented by Advantest at SAE’s WCX World Congress in Detroit (April 10-12). Rugged, on-board sensors are in high demand for automotive applications, where their usage ranges from reducing carbon-dioxide emissions to enabling ADAS-enabled vehicles.
Keynote speakers revealed for VOICE 2018
The technical programme and keynote speakers have been announced for Advantest’s VOICE 2018 Developer Conference. The conference will return to San Diego, California (May 15-16) and Hsinchu, Taiwan (May 23) under the unifying theme "Measure the Connected World and Everything in It.”
Automotive sensors test system heads to Detroit
An advanced test solution for microelectronic pressure sensors used in making advanced driver-assistance systems (ADAS) for the global automotive market will be exhibited by Advantest during the ADAS Sensors 2018 conference in Detroit-Dearborn (April 4-5).
Silicon validation alternative ready for Dresden DATE
CloudTesting Services (CTS) will be showcased by Advantest at DATE 2018, the European event for electronic systems design and test in Dresden (March 19-23). The CTS test solution offers the latest high-quality test methods utilising on-demand IPs, characterisation tools, analysis and more.
Chinese university buys two Advantest test systems
Leading semiconductor test equipment supplier Advantest has sold two engineering test stations – a T5830ES and a T5833ES system – to Tsinghua University, the top academic institution in China, in the latest business dealing between the two organisations.