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Parallel testing for NAND flash memories gets a boost
Two additional members of its next-generation B6700 family of burn-in memory testers have been announced by Advantest. The B6700L and B6700S models are designed to lower the cost of test while boosting the parallel testing capacity for NAND flash memories now in high demandfor server and mobile data-storage applications.
Comprehensive test solutions on parade at ITC 2018
Hardware, software and online test solutions will be showcased by Advantest at the 2018 International Test Conference (ITC) in Phoenix (October 28-November 2). Demonstrations of its on-demand CloudTesting Service, the latest capabilities of its EVA100 analogue/mixed-signal IC test solution, a novel facial-recognition tool that combines cloud and real-time edge-computing artificial intelligence (AI) and a new tool for power profiling devices under...
Market demand prompts next-generation memory tester
A next-generation B6700D memory burn-in tester to meet growing global customer demand for server and mobile data-storage solutions during the memory market’s current super cycle has been unveiled by Advantest. By measuring the functions of NAND flash and DRAM memory devices during burn-in, this new tester delivers both high throughput and a low cost of test.
VOICE 2019 opens Call for Papers
Advantest has opened the call for papers for the international VOICE 2019 Developer Conference, focusing on innovative test solutions and best practices using the V93000 and T2000 system-on-chip (SoC) test platforms as well as Advantest memory testers and handler solutions.
Smart Scale Tester for upcoming generation of server processors
Semiconductor test equipment supplier, Advantest Corporation, has installed its 3,000th V93000 Smart Scale test system for use by its long-term customer AMD, in evaluating AMD Ryzen, AMD Radeon and AMD EPYC compute, graphics and data centre products.
E-beam lithography system features at MNE show
Leading semiconductor test equipment supplier Advantest will feature its F7000 EB (electron beam) lithography system and other nanotechnology-ready equipment at the Micro and Nanoengineering (MNE) show in Copenhagen (September 25-27). The MNE program and exhibition covers current and relevant activities in micro- and nanoengineering.
Expanded global attendance breaks conference records
The VOICE 2018 Developer Conference staged by Advantest has set new records with 177 submitted abstracts representing contributions from 13 countries. In addition to more than 90 technical presentations, VOICE 2018 featured informative Partners’ Expos, highly rated keynote speakers, 25 interactive technology kiosks and multiple networking opportunities.
Integrated SSD tester features at Flash Memory Summit
Semiconductor test equipment supplier Advantest will display its new testing capabilities for PCIe Gen 4 solid-state drives (SSDs) using its MPT3000 testers and present two technical papers at the Flash Memory Summit (August 7-9) in Santa Clara, California. Advantest is a gold sponsor of this year’s Summit.
Holistic test solution streamlines SSD transition
A fully integrated test solution for developing, debugging and mass producing PCIe Gen 4 solid-state drives (SSD) has been launched by Advantest on the MPT3000 platform. This is the same tester used by manufacturers of PCIe Gen 3, SATA and SAS SSDs. The all-inclusive test solution enables SSD manufacturers to accelerate their newest products’ time to market.
Advantest participates on all fronts at SEMICON West
Leading semiconductor test equipment supplier Advantest will be active on the exhibit floor, in the technical program and in the classroom at SEMICON West 2018 in San Francisco (July 10-12). Advantest will showcase its new FVI16 floating power VI source, which gives the V93000 single scalable platform the industry’s best VI signal performance.