Search results for "advantest"
Semiconductor test solutions enabling 5G connectivity
Semiconductor test equipment supplier Advantest Corporation has announced that it will feature its wide range of solutions for advanced IC testing and wafer metrology at SEMICON Korea on January 23rd to 25th at COEX in Seoul, South Korea. Among the products that Advantest will feature in booth #C510 in Hall C are systems and enhancements that the company has recently announced.
Keynote speakers unveiled for VOICE 2019
Registration has opened for Advantest's VOICE 2019 Developer Conference, along with the announcement of the full keynote speaker line up for the US program. The conference will be held in two new locations – Scottsdale, Arizona on May 14-15 and Singapore on May 23 – under the unifying theme “Measure the Connected World and Everything in It”.
Experiment confirms high-speed potential of STT-MRAM
A collaboration between Advantest and Tohoku University’s Center for Innovative Integrated Electronic Systems led by Tetsuo Endoh has successfully demonstrated operation of a high-writing-speed spin-transfer torque magnetic random access memory (STT-MRAM) using an Advantest memory test system.
Photomask measurement tool increases throughput
A tool that measures fine pattern dimensions on photomasks with higher precision and stability has been launched by Advantest. The E 3650 MASK MVM-SEM (Multi Vision Metrology Scanning Electron Microscope) uses the company’s proprietary technology.
Memory tester meets 5G chip needs
The T5851 STM16G memory tester from Advantest is for evaluating high-speed protocol NAND flash memories including UFS3.0 universal flash storage and PCIe Gen 4 NVMe solid-state drives (SSD), both of which are expected to be in high demand for the LTE 5G communications market.
Module extends tester's range to high-voltage semiconductors
A module for its EVA100 measurement system that enables testing of high-power ICs used in large-volume consumer applications has been introduced by Advantest. With the new HVI (high-voltage VI source and measurement) module, chip makers can ensure the reliability of power devices in widely used applications such as AC/DC and DC/DC converters, motor controllers, LED drivers and gate drivers by accurately measuring their current leakage and breakdo...
Cloud-based test service on parade at electronica
Measurement tools and solutions for automotive, communications and consumer devices will be showcased by Advantest at electronica in Munich, Germany (13-16 November). Visitors will be able to attend demonstrations of the on-demand CloudTesting Service, and see the latest capabilities of its EVA100 analogue/mixed-signal IC Test solution and theV93000 A-Class SoC test system for device engineeringand production, as well as its HA7300 stimulus test ...
Duo develop STT-MRAM testing module
A collaboration between Advantest and Tohoku University’s Center for Innovative Integrated Electronic Systems (pictured), led by Tetsuo Endoh has successfully developed a high-speed, high-precision module that can measure the switching currents in the memory arrays of spin-transfer torque magnetic random access memory (STT-MRAM) in units of microamperes and nanoseconds, using an Advantest memory test system.
Duo ally on semiconductor test software initiative
Test Systems Strategies (TSSI), and Advantest CloudTesting Service (CTS), have announced a new software module to convert electronic design automation (EDA) formats (e.g., VCD, EVCD, WGL, STIL) to the Advantest CTS CX1000 platform.
Parametric tester meets 28nm to 3nm process node needs
Leading semiconductor test equipment supplier Advantest has released its V93000 SMU8 parametric tester to meet chip makers’ process-characterisation and monitoring needs for the exacting measurements required on the 28nm to 3nm process nodes and beyond.