Companies

Keithley Instruments GmbH

Keithley Instruments GmbH Articles

Displaying 141 - 160 of 197
Test & Measurement
12th February 2009
Keithley Web-Based Seminar Covers Hall Effect Measurements

Keithley Instruments will broadcast a free, web-based seminar titled “Hall Effect Measurements Fundamentals” on Thursday, February 19, 2009. This one-hour seminar will introduce the topic of Hall Effect measurements as they relate to semiconductor materials and device characterization. To register for this event, visit www.keithley.com/events/semconfs/webseminars.

Test & Measurement
4th February 2009
Keithley Releases its 2009 Test And Measurement Product Guide

Keithley Instruments, Inc has announced the release of its 2009 Test and Measurement Product Guide. The 144-page guide offers details and technical specifications on Keithley’s general-purpose and sensitive sourcing and measurement products, DC switching, RF switching and measurement, data acquisition solutions, semiconductor test systems, and optoelectronics test.

Test & Measurement
26th November 2008
Keithley’s Component Test Solution Combines Ease of Use with Curve Tracer Capabilities

Keithley Instruments has announced its ACS Basic Edition, characterization and curve tracer software for component test applications. The latest addition to Keithley's powerful Automated Characterization Suite (ACS) family, ACS Basic Edition integrates with the industry’s broadest range of source-measure units, Keithley's SourceMeter Instrument family. ACS Basic Edition, pared with Keithley’s proven line of SourceMeter instruments, replaces o...

Test & Measurement
24th November 2008
Keithley to Develop RF WiMAX Production Test Solution for Fujitsu

Keithley Instruments has announced that it is developing a WiMAX device production test solution for two 802.16e WiMAX devices from Fujitsu Microelectronics Limited. This WiMAX RF SISO/MIMO manufacturing test configuration features Keithley’s award-winning RF test solutions, the Model 2820 RF Vector Signal Analyzer and Model 2920 RF Vector Signal Generator. The configuration will enable Fujitsu Microelectronics to perform a set of Tx and Rx tes...

Test & Measurement
30th October 2008
Keithley Creates RF Communications Toolkit Software to Provide Both Signal Generation and Analysis

Keithley Instruments has expanded its powerful SignalMeister software platform to now include RF signal analysis along with RF signal generation. First introduced in 2007, SignalMeister software is now the only software package on the market that integrates signal generation and analysis into one package for unmatched speed and simplicity. Furthermore, SignalMeister now has the capability of generating and analyzing both single-input single-outpu...

Test & Measurement
24th October 2008
Ubiquisys Employs Keithley RF Test Systems

Keithley Instruments has announced that its award-winning RF test solutions, including the Series 2800 RF Vector Signal Analyzers and Series 2900 RF Vector Generators, are established in production with Ubiquisys, Ltd., a leading developer of 3G femtocells. Ubiquisys has been using Keithley’s RF test solutions as it ramps its femtocell production at Sony UK Tech.

Test & Measurement
15th October 2008
Keithley Introduces 50MHz Arbitrary Waveform/Function Generator

Keithley Instruments, Inc has introduced the Model 3390 50MHz Arbitrary Waveform/Function Generator, featuring the highest waveform resolution and best price-to-performance value in its class. The Model 3390 is a flexible, easy-to-use programmable signal generator with advanced function, pulse, and arbitrary waveform capabilities. Superior signal integrity, faster rise and fall times, lower noise, and greater waveform memory combine to provide hi...

Analysis
8th October 2008
ip.access Chooses Keithley for Mass-Market Femtocell Production Testing

Keithley Instruments has announced that ip.access, a developer of femtocell and picocell solutions, has purchased Keithley’s award-winning Radio Frequency (RF) test solutions. ip.access has selected Keithley’s Series 2800 RF Vector Signal Analyzers and Series 2900 RF Vector Generators as the solution for its production testing of WCDMA femtocell base stations.

Test & Measurement
24th September 2008
Keithley Launches New Instrument Platform

Keithley Instruments has announced its Series 2600A System SourceMeter Instrument family. They provide unmatched ease-of-use, measurement performance, and flexibility in order to speed time-to-market for its users, lower cost of test, and simplify the process of making high performance measurements.

Power
24th September 2008
Dual-Channel Power Supply Optimized for Testing Portable Battery-Powered Devices

Keithley Instruments has introduced the Model 2308 Portable Device Battery/Charger Simulator, a dual-channel battery- and charger-simulating power supply designed to provide the lowest cost testing of both the growing range of mobile phones with new, complex transmission schemes and other types of new portable devices that consume extremely low amounts of power. The Model 2308’s fast transient output response maximizes production yields by main...

Test & Measurement
20th August 2008
Keithley Expands MIMO RF Measurement Capabilities with 8x8 MIMO Test System

Keithley Instruments is extending its lead in RF MIMO (multiple-input, multiple-output) test with what it says is the industry’s first measurement-grade 8x8 MIMO system. The system is used for primary research of next-generation RF MIMO devices and technologies.

Test & Measurement
28th July 2008
Keithley's Guide to Wireless and RF Testing

Keithley Instruments has announced the availability of Advanced Measurement Techniques for OFDM- and MIMO-based Radio Systems: Demystifying WLAN and WiMAX Testing, a new guide to wireless and RF testing. This CD contains useful and informative RF testing resources, including application notes, articles, white papers, and product demonstrations, to help engineers reduce their cost of test by simplifying and solving the most challenging RF measurem...

Test & Measurement
16th July 2008
Upgrade for Model 4200-SCS Semiconductor Characterization System Expands C‑V, I-V, and Pulsed I-V Characterization

Keithley Instruments has introduced Keithley Test Environment Interactive (KTEI) V7.1 for the company’s award-winning Model 4200-SCS Semiconductor Characterization System. This software upgrade includes support for testing higher power semiconductor devices. With support for low-level device characterization through higher power devices, the Model 4200-SCS is the most complete semiconductor characterization analyzer on the market, making tough ...

Test & Measurement
18th June 2008
Keithley Adds WiMAX Testing Capability to its RF Test Instrument Family

Keithley Instruments, Inc. today announced a set of signal creation and analysis tools that extend its RF test capabilities to include WiMAX signal testing. Keithley’s new solution is built on a next-generation hardware platform that makes it simple and inexpensive to add support for new signal standards, such as 802.16e mobile WiMAX Wave 2 testing with up to 4x4 MIMO channels, without requiring expensive hardware upgrades or different instrume...

Design
17th June 2008
Keithley Launches SignalMeister™ Version 2.0 as Only Waveform Creation Software with Object-Oriented User Interface Optimized for MIMO

Keithley Instruments, Inc. today introduced Version 2.0 of its SignalMeister™ Waveform Creation Software, a powerful RF development tool with next-generation performance and usability. SignalMeister 2.0 features a new, “object-oriented” graphical user interface (GUI) and is the only waveform creation software on the market that uses a click-and-drag objects-based approach, allowing RF engineers to intuitively create basic and complex wavefo...

Test & Measurement
16th June 2008
Keithley and Azimuth Systems Collaborate to Create LTE, WiMAX RF Testing Solutions

Keithley Instruments has announced a joint effort with Azimuth Systems, a leading provider of wireless broadband test equipment and channel emulators for WiMAX, 4G, and Wi-Fi (Acton, MA). Keithley is working with Azimuth Systems to deliver critical end-to-end MIMO RF test solutions to mobile handset manufacturers, infrastructure vendors, and service providers for next-generation LTE and WiMAX testing. Keithley and Azimuth will jointly discuss the...

Test & Measurement
8th May 2008
Semiconductor Device Test Applications CD from Keithley Semiconductor

Keithley Instruments has announced the availability of its Semiconductor Device Test Applications Guide. In addition to the Applications Guide, this CD also includes a large variety of semiconductor test application information such as applications notes, white papers, and presentations that enables users to reduce their cost of test while simplifying the most challenging applications.

Test & Measurement
6th May 2008
Keithley Releases New Edition of Switching Handbook

Keithley Instruments has released the sixth edition of its Switching Handbook: A Guide to Signal Switching in Automated Test Systems. At more than 180 pages, this newest handbook covers the fundamentals of the switching function in test and measurement applications, providing useful, tutorial information on how to optimize switching test systems.

Test & Measurement
30th April 2008
ACS Test System Now Completes Wafer Level Reliability Testing up to Five Times Faster

Keithley Instruments has enhanced its Automated Characterization Suite (ACS) software to include optional wafer level reliability (WLR) test tools for semiconductor reliability and lifetime prediction testing applications. Version 4.0 builds on the ACS software’s existing single- and multi-site parallel test capabilities, adding a database capability, as well as software tools and optional licenses for the new Reliability Test Module (RTM) and ...

Analysis
28th March 2008
Keithley Partners with Chinese IMC Research Lab to Aid in Future RF Test Development

Keithley Instruments has announced a partnership with the Institute of Mobile Communications (IMC) of Southwest Jiaotong University in Chengdu, China. The partnership calls for the IMC and Keithley to work together on joint research projects to expand existing applications as well as research emerging wireless applications and technologies.

First Previous Page 8 of 10 Next Last

Featured products

Product Spotlight

Upcoming Events

View all events
Newsletter
Latest global electronics news
© Copyright 2024 Electronic Specifier