Keithley Instruments has announced the newest release of hardware and software advances for its Model 4200-SCS Semiconductor Characterization System, representing the next step in pulse test offerings for the Model 4200-SCS. The lab-based system incorporates tightly integrated DC and pulse measurement capabilities with complete application packages for turn-key solutions. An enhanced pulse generator card and a new scope card offer powerful new c...

Keithley Instruments, Inc. has announced Nano Days, an on-line nanotechnology educational event from April 24 through April 26, 2007. During this virtual conference, the theme of which is VISUALIZE, CHARACTERIZE, REALIZE: The Future of Nanotechnology, leading researchers from academia and business leaders from industry will present cutting edge measurement technology for nanoscale devices and materials. For more information about the conference p...

Keithley Instruments, Inc., a leader in solutions for emerging measurement needs, announces the availability of its 2007 Test and Measurement Product Catalogue. This desktop reference guide offers details and specifications on Keithley's general-purpose and sensitive sourcing and measurement products, DC switching, RF switching and measurement, data acquisition solutions, semiconductor test systems, and optoelectronics test hardware.

Keithley Instruments, Inc., a leader in solutions for emerging measurement needs, has released the Simplified Test Toolkit, an interactive tutorial CD that helps test engineers overcome tough measurement challenges. The CD offers a collection of useful technical seminars to help engineers in creating more powerful and effective yet simple test and measurement applications.

Keithley Instruments, Inc. has been recognized for outstanding customer satisfaction by VLSI Research Inc, a global leader in providing independent customer evaluations of semiconductor equipment suppliers. VLSI has awarded Keithley a five star rating among Process Diagnostics companies, the highest possible rating for overall customer satisfaction.

Keithley Instruments has published Parallel Test Technology: The New Paradigm for Parametric Testing, a semiconductor parametric test handbook. The 60-page handbook offers an overview of the emerging test technique known as parallel parametric testing, a strategy for wafer-level parametric testing that uses concurrent execution of multiple tests on multiple scribe line test structures and helps semiconductor fabs maximize their test throughput a...

Keithley Instruments has announced its Model KPCI-488LP Low Profile GPIB Controller Interface plug-in board. A complement to Keithley's precision measurement instruments, the Model KPCI-488LP is priced at only EURO 369, helping test engineers to further lower their cost of test and ownership. To reduce switching costs, the Model KPCI-488LP's driver library is fully command compatible with Keithley, Capital Equipment Corporation (CEC), and Nationa...

Keithley Instruments has announced the release of KTE Interactive V6.1, an updated version of its powerful KTEI (Keithley Test Environment Interactive) measurement software for its Model 4200-SCS Semiconductor Characterization System. The new KTEI 6.1 software enhances the pulse I-V capabilities of Keithley's Model 4200-PIV and significantly improves pulse and DC measurement correlation.

Keithley Instruments has introduced a new line of PXI products designed for high speed automated production testing as part of a hybrid test system using precision instruments. Test engineers and designers can combine the high-speed data acquisition and tight trigger synchronization features of the new KPXI products with the precision measurement capabilities in Keithley instruments for a superior hybrid test system architecture. Taking advantage...

Keithley Instruments, Inc. introduces a new line of PXI products designed for high speed automated production testing as part of a hybrid test system using precision instruments.

Keithley Instruments has announced it has partnered with Mesatronic Group (Voiron, France) to develop advanced probe cards for semiconductor parametric testers used in RF and low current DC applications.

Keithley Instruments introduces the Model 2810 RF Vector Signal Analyzer, optimized for automated testing of wireless devices and transmitter circuits in production test environments, as well as in new product and device research and development. It features measurement speeds up to three times faster than competitive instruments in production test, takes up half the space, and costs half as much as competitive products.

Keithley Instruments has announced the release of the Model 3500 Portable RF Power Meter, the first lab-quality, handheld RF power meter on the market. Designed to make RF power measurements in both field and R&D lab environments, the compact Model 3500 provides the accuracy of a benchtop RF power meter with the convenience of a portable instrument at half the cost of competing products.

Keithley Instruments has announcesd that its Metrology Services Group is now accredited to ISO/IEC 17025:2005, the single most important metrology standard for test and measurement, by the A2LA (American Association for Laboratory Accreditation). This latest accreditation expands the list of Keithley certifications by industry-recognized standards for quality such as ISO 14001 and ISO 9001.

Keithley Instruments has co-developed and sponsored the first Nanotechnology Test Weblog, or Blog, designed exclusively for engineers and researchers dealing with electrical testing issues in the field of nanotechnology and MEMS (micro electromechanical systems). The Nanotest Weblog keeps visitors abreast of the latest news in the nanotechnology and MEMS industry through frequent posts of technical and business developments. The Weblog is coord...

Keithley Instruments has teamed with R&D Magazine to create a Nanotechnology Test & Measurement Applications Contest for researchers and test innovators who are making complex and advanced electrical measurements on nanoscale materials and devices.

Keithley Instruments has introduced the Series 3400 Pulse/Pattern Generators. They provide superior signal quality and precise control for pulse widths from three nanoseconds to 1000 seconds, as well as a simple, intuitive user interface. Series 3400 pulse and pattern generators are ideal for semiconductor device and material research and characterization, as well as in process integration and advanced materials research applied to such projects ...