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Keithley Instruments GmbH Articles
Keithley Partners with Stratosphere Solutions to Enable Advanced Process Characterization at Sub-65nm
Keithley Instruments has announced a partnership with Stratosphere Solutions, a provider of innovative parametric yield improvement solutions for integrated circuit manufacturers. Keithley’s partnership with Stratosphere Solutions will address advanced process development and monitoring using an Array TEG (test element group) technology.
2008 Test and Measurement Product Guide from Keithley
Keithley Instruments has announced its 2008 Test and Measurement Product Guide. This handy product guide offers details and specifications on Keithley's general-purpose and sensitive sourcing and measurement products, DC switching, RF switching and measurement, data acquisition solutions, semiconductor test systems, and optoelectronics test hardware. Tutorials simplify choosing solutions for specific applications.
Keithley Software Offers New Parallel Test and Parametric Die Sort Features for Higher Throughput
Keithley Instruments has announced the availability of ACS (Automated Characterization Suite) V3.2 software for semiconductor test and characterization at the device, wafer, and cassette level. Version 3.2 further enhances the powerful automation capabilities of ACS integrated test systems by adding more powerful multi-site parallel test capabilities, results binning for die sort applications, new wafer level plotting capabilities, and support fo...
Keithley Joins WiMAX Forum
Keithley Instruments has become a member of the WiMAX Forum. The WiMAX Forum is an industry-led, non-profit organization responsible for promoting and certifying interoperable WiMAX products. WiMAX technology enables wireless high-speed Internet access for laptops and other mobile devices over much longer distances than current wireless technologies such as Wi-Fi.
Industry Leading MIMO RF Test Solution from Keithley
Keithley Instruments, Inc. has released the industry’s leading 4X4 MIMO (multiple-input, multiple-output) RF test system for R&D and production testing of next generation RF communications equipment and devices.
New Integrated C-V Module and Software in Market-Leading 4200-SCS from Keithley
Keithley Instruments, Inc. announces a new C-V measurement instrument for its powerful Model 4200-SCS Semiconductor Characterization System. The Model 4200-CVU instrument comes as a module that plugs into any available instrument slot of the Model 4200-SCS, allowing fast and easy capacitance measurements from femtoFarads (fF) to nanoFarads (nF), at frequencies from 10kHz to 10MHz.
Keithley’s German Service Centre Joins List of ISO 17025 Accredited Laboratories
Keithley Instruments has announced today that the American Association for Laboratory Accreditation (A2LA) has accredited Keithley’s German service center to ISO/IEC 17025:2005, the single most important metrology standard for test and measurement products. At the same time, the Metrology Services Department at Keithley’s Cleveland headquarters, which received A2LA ISO/IEC 17025:2005 accreditation a year ago, dramatically expanded its capabil...
Keithley and CNSI Announce Nanotechnology Measurement Partnership
Keithley Instruments today announced a new partnership with The California NanoSystems Institute at UCLA. The partnership is designed to support research collaboration in the pursuit of nanotechnology and nanoscience solutions for the semiconductor industry’s next generation instrumentation and measurement requirements. Keithley and the CNSI will share research information to further the understanding of nanotechnology and nanoelectronic techno...
Keithley Adds Low Current Capability to semiconductor parametric analysis and testing system
Keithley Instruments has announced two new additions to its Series 2600 SourceMeter Instruments to create what it says is the industry’s most advanced and cost effective solution for semiconductor parametric analysis and testing. The Models 2635 and 2636 represent a new and unique way of doing parametric analysis at resolutions as fine as 1fa (10-15 amp), which is often required for many semiconductor, optoelectronic, and nanotechnology devices...
System Switch Platform Offers High Throughput Signal Switching, LXI Class B, and Optional High-Performance Integrated DMM
Keithley Instruments has announced the release of the Series 3700 System Switch/Multimeter and Plug-in Card Family, Keithley’s next-generation platform of switching and integrated digital multimeter (DMM) test solutions. It offers high quality, instrument grade switching for a wide variety of applications, including the performance demands of high channel count applications, with its ability to control up to 576 multiplexer channels in an indus...
Keithley Announces New Software Platform for RF Waveform Generation
Keithley Instruments, Inc. announces the release of SignalMeister™ Waveform Creation Software for Keithley’s award-winning line of RF vector signal generators. Keithley’s SignalMeister is a free, PC-based software tool that creates arbitrary waveform (ARB) files that can be downloaded to Keithley’s Model 2910 RF Vector Signal Generator. SignalMeister is an expandable software platform with a common user interface that allows integration o...
Keithley Instruments adds RF Waveform Technology with acquisition of Lyocom
Keithley Instruments has announced the acquisition of Lyocom, Inc., a private company located in Richfield, Ohio USA. Terms were not disclosed. Lyocom develops and sells software algorithms used for generating and analyzing complex digital waveforms. Keithley currently offers a broad suite of measurement capabilities for developers and manufacturers of wireless devices and products, so this technology extends Keithley’s solutions to include WiM...
Keithley Instruments Acquires RF Waveform Technology
Keithley Instruments, Inc (NYSE:KEI), a leader in solutions for emerging measurement needs, announced the acquisition of Lyocom, Inc., a private company located in Richfield, Ohio. Terms were not disclosed. Lyocom develops and sells software algorithms used for generating and analyzing complex digital waveforms. Keithley currently offers a broad suite of measurement capabilities for developers and manufacturers of wireless devices and products, s...
Keithley Announces Joint Development Partnership with France’s CEA Leti Laboratory
Keithley Instruments has announced that it has entered into a Joint Development Partnership (JDP) surrounding semiconductor device material testing technology with CEA Leti, one of the world’s most sophisticated semiconductor development laboratories. The JDP calls for Keithley and CEA Leti to research methods for characterizing advanced semiconductor materials and devices that support DC, high frequency, and RF-level signals on both micro- and...
Recognition for Keithley Instruments by TI
Keithley Instruments has announced that it has received the Texas Instruments 2006 Supplier Excellence Award. The annual award honours firms whose dedication and commitment in supplying products and services meet TI's high standards for excellence. Recipients are chosen for their exemplary performance in the areas of cost, environmental responsibility, technology, responsiveness, assurance of supply, and quality. TI’s management team from the W...
6½-Digit USB DMM from Keithley
Keithley Instruments has announced its Model 2100 6½-Digit USB Digital Multimeter (DMM), a high precision, low-cost USB-based instrument. The Model 2100 is ideal for a wide range of production test, burn-in, and manual and semi-automatic research and development applications in bench, portable, or small system measurement configurations. The Model 2100 is being offered for a limited-time introductory price of only EUR 595.
Vector Signal Generator accommodates more and larger waveforms
Keithley Instruments, Inc. has announced a series of enhancements to its Model 2910 RF Vector Signal Generator. The new capabilities included in the Model 2910 V2.0 include additional wireless signal generation waveforms, a new power calibration feature, and increased ARB memory to accommodate more and larger waveforms.
Handbook on Nanotechnology Measurement
Keithley Instruments has announced the availability of its Nanotechnology Measurement Handbook, a 124-page guide to electrical measurements for nanoscience applications. The handbook offers practical assistance in making precision low level DC and pulse measurements on nanomaterials and devices and provides an overview of the theoretical and practical considerations involved in measuring low currents, high resistances, low voltages, and low re...
Integrated Test Systems for Faster and Easier Semiconductor Testing
Keithley Instruments has announced the availability of ACS (Automated Characterization Suite) integrated test systems for semiconductor characterization at the device, wafer, and cassette level. With ACS integrated test systems, Keithley has created a variety of highly configurable and flexible test systems for semiconductor characterization that offer unique measurement capabilities with powerful automation-oriented software. ACS test systems pr...
Data Acquisition, Measurement, and Control Handbook from Keithley
Keithley Instruments, Inc. has published Understanding New Developments in Data Acquisition, Measurement, and Control. The 220+page data acquisition handbook is a practical guide to high performance test and measurement and is free at http://www.ggcomm.com/Keithley/MAR07DAQ_NR.html