Keithley Instruments will broadcast a free webinar titled “Understanding MIMO Channel Sounding” on Thursday, September 24, 2009. This one-hour web-based seminar will introduce the topic of MIMO channel sounding as it relates to characterizing a real-world MIMO wireless channel, which can be used in RF testing of a device by applying channel emulation. To register for this event, visit http://event.on24.com/r.htm?e=161538&s=1&k=36EA7DA283CEA8...

Keithley Instruments has enhanced its popular ACS Basic Edition software, adding support for a broader line of source-measure (SMU) instrumentation. This broader choice of compatible instruments should prove especially useful in expanding the software’s voltage and current limits available for testing solar cells, photovoltaic panels, and discrete power semiconductors. ACS Basic Edition combines high speed hardware control, device connectivity,...

Keithley Instruments, Inc will be presenting a two-hour workshop entitled “LTE testing – understanding how your LTE radio is performing” on the first day of European Microwave Week (EuMW), which takes place in Rome, Italy, from September 29 to October 1, 2009. Attendance at the workshop is free of charge, but registration is required. For further details and to register, visit http://www.keithley.eu.com/art_resource.php?sid=kquj.2dfmrki.

Keithley Instruments has created an application-specific microsite for those responsible for characterizing solar/photovoltaic devices. “Simplify Your Solar Cell Testing with Keithley’s Precision Measurement Solutions” describes Keithley’s high accuracy solutions for solar cell I-V and C-V characterization, which allow high speed testing without the hassles of integrating separate instruments or writing complicated programs. It also descr...

Keithley Instruments has announced an expansion of its Series 3700 System Switch/Multimeter and plug-in card family with the addition of a new plug-in switching card, the Model 3731 6´16 High Speed, Reed Relay, Matrix Card. Its voltage and current characteristics (200V, 1A switched or 2A carry signal capacity) make it ideal for use in multi-channel I-V testing in conjunction with Keithley’s Series 2600A System SourceMeter instruments.

Keithley Instruments has announced the addition of a Web-browser-based, multi-channel graphing toolkit capability to its Series 3700 System Switch/Multimeter family. This new data visualization capability, which is included at no charge in the firmware for all new Series 3700 mainframes, offers users a quick and easy way to observe measurement data vs. time as channel measurements are made with the optional built-in digital multimeter, without t...

During the Femtocells World Summit 2009 in London, June 23 - 25, 2009, representatives from Keithley Instruments will be on hand to demonstrate the Keithley-ACE Solution manufacturing test solution for femtocells based on the picoChip PC202 Integrated Baseband Processor and the PC205 High Performance Integrated PHY Processor.

Keithley Instruments has introduced the Model 2891-IQ Upconverter, which provides comprehensive support for transceiver testing by processing analog I and Q baseband signals for testing a transceiver’s transmitter, as well as processing analog I and Q output signals for testing a transceiver’s receiver.

Keithley Instruments has announced that it has upgraded its popular RF Vector Signal Analyzer line with new capabilities that reduce signal acquisition and measurement times. The new Model 2820A RF Vector Signal Analyzer, which provides a 40MHz signal acquisition bandwidth with a frequency range of either 400MHz–4GHz or 400MHz–6GHz, builds on the capabilities of Keithley’s Series 2800 signal analyzer line. It expands the line’s applicatio...

Keithley Instruments will broadcast a free, web-based seminar titled “Semiconductor Capacitance-Voltage (C-V) Fundamentals,” which will be presented by Electronic Design magazine. Lee Stauffer, Senior Staff Technologist for Keithley’s Semiconductor Measurements Group will present the webinar and take questions from the audience at the end. The webinar will be broadcast on Tuesday, June 2, at 2:00 p.m. ET (11:00 a.m. PT).

Keithley Instruments will broadcast a free, web-based seminar titled “Photovoltaic Measurements: Testing the Electrical Properties of Today’s Solar Cells.” It will be broadcast on Wednesday, May 27. This one-hour seminar will provide an overview of the electrical measurements used in photovoltaic device development from basic research to early production testing. To register for this event, visit www.keithley.com/events/semconfs/webseminars...

Keithley Instruments has introduced what it says is the test industry’s only cabling solutions capable of handling I-V, C-V, and pulsed I-V signals with a single set of cables (patent pending). The new cabling kits are based on a patent-pending design that speeds and simplifies the process of making DC Current‑Voltage (I‑V), Capacitance‑Voltage (C‑V), and pulsed I‑V testing connections from any modern semiconductor...

Keithley Instruments has introduced a variety of hardware, firmware, and software enhancements to its Model 4200-SCS Semiconductor Characterization System. The Keithley Test Environment Interactive (KTEI) V7.2 upgrade includes nine new solar cell test libraries, an expanded frequency range for the system’s Capacitance-Voltage (C-V) measurement capability, and support for the company’s new nine-slot Model 4200-SCS instrument chassis.

Keithley Instruments has announced its results for its fiscal 2009 second quarter ended March 31, 2009. Net sales of $24.0 million for the second quarter of fiscal 2009 decreased $15.9 million, or 40 percent, from net sales of $39.9 million in last year’s second quarter. Sales outside of the Americas represented approximately 70 percent of total sales for the second quarter of fiscal 2009. Two percentage points of the decrease was the result ...

Keithley Instruments is launching a European City Seminar Tour starting on April 23, 2009. The tour will visit 22 European cities in Belgium, France, Germany, Italy, The Netherlands, Sweden, Switzerland, and the UK throughout April and May. Attendance is free of charge but registration is required. To see detailed local seminar information and to register, visit www.keithley.info/cityseminars09

Keithley Instruments has published a white paper on how semiconductor characterization and parametric test solutions are evolving to keep pace with rapid changes in the semiconductor industry. The white paper, which can be downloaded at www.keithley.com/navigate, describes the emerging technology and business dynamics affecting the industry, including the growing need for vendor support.

Keithley Instruments has introduced a variety of hardware, firmware, and software enhancements to its award-winning Model 4200-SCS Semiconductor Characterization System. The Keithley Test Environment Interactive (KTEI) V7.2 upgrade includes nine new solar cell test libraries, an expanded frequency range for the system’s Capacitance-Voltage (C-V) measurement capability, and support for the company’s new nine-slot Model 4200-SCS instrument chas...

Keithley Instruments has introduced what it says is the test industry’s only cabling solutions capable of handling I-V, C-V, and pulsed I-V signals with a single set of cables (patent pending). The new cabling kits are based on a patent-pending design that speeds and simplifies the process of making DC Current‑Voltage (I‑V), Capacitance‑Voltage (C‑V), and pulsed I‑V testing connections from any modern semiconductor...

Keithley Instruments will broadcast a webcast seminar titled “Practical Tips and Tricks for Avoiding Common Pitfalls when Implementing Parallel Test” on Thursday, March 26, 2009. This one-hour seminar will offer guidance on migrating from sequential test to parallel test and explore ways to maximize resource utilization, balance system controller duties efficiently, and manage control of test timing and sequencing.

Keithley Instruments has announced that it is discontinuing its S600 Series parametric test product line. The Company will continue to accept orders for S600 Series testers until February 2010 and will continue to provide technical support, calibration, and repair services for five years through February 2014.