Search results for "advantest"
Tester integrates burn-in and core testing for 5G ICs
Advantest has ramped up its H5600 family of memory testers by introducing the new H5620ES engineering test system, designed for both high-speed burn-in and core testing of today’s DDR4, next-generation DDR5, and low-power, double-data-rate (LPDDR) devices in laboratory environments.
RF channel cards cut test costs and time to market
Semiconductor test equipment supplier Advantest has introduced the newest generation of its Wave Scale RF channel cards for the V93000 platform to address the growing market demand for Wi-Fi 6E, 5G-NR transceivers, LTE-Advanced Pro and IoT communication devices operating at frequencies up to 8GHz.
Advantest announces support for TCFD recommendations
Advantest has announced its support for the recommendations of the TCFD (Task Force on Climate-related Financial Disclosures).
Memory tester integrates burn-in and memory-cell testing
A memory tester that combines the capabilities to perform both burn-in and memory-cell testing for advanced DRAMs and LPDDR (low-power, double-data-rate) devices has been launched by Advantest.
VOICE 2020 postponed until September
Advantest has postponed its VOICE 2020 Developer Conference in Scottsdale, Arizona due to health and safety concerns over the COVID-19 pandemic.
Test equipment delivers multiple solutions at SEMICON Korea
Semiconductor test equipment supplier Advantest will feature its newest test solutions for advanced ICs at SEMICON Korea in Seoul, South Korea (February 5-7). In addition to high-speed memory test solutions, Advantest will exhibit a wide range of products and solutions that contribute to the 5G revolution and accelerate the development of other applications such as ADAS/autonomous driving, IoT/smart devices and AI.
Advantest lines up keynote speakers for VOICE 2020
Keynote speakers for the Advantest VOICE 2020 Developer Conference in the U.S. and China have been announced. The conference will return to two popular locations – Scottsdale, Arizona on May 12-13 and Shanghai, China on May 22 – with the theme “Your Voice. Your Vision. Our Value.”
5G and AI test solutions set for SEMICON Japan
Semiconductor test equipment supplier Advantest will exhibit a wide variety of its latest products and solutions at SEMICON Japan 2019 (December 11-13) at Tokyo Big Sight. Advantest’s exhibit will address the test challenges of advanced ICs that make 5G communication a reality and accelerate the development of other cutting-edge applications, from AI/machine learning and smart manufacturing to smart cities.
5G device test system makes European debut in Munich
The European debut of Advantest’s V93000 Wave Scale Millimeter test solution will take place at SEMICON Europa in Munich (November 12-15). It extends the capabilities of the V93000 system to cost-efficiently test the next generation of 5G-NR radio frequency devices and modules on a single scalable platform.
ITC 2019 provides platform for online test service
Hardware, software and online test solutions will be presented by Advantest at the 2019 International Test Conference (ITC) in Washington D.C. (November 12-14). It will also supply paper, panel and poster contributions. Advantest is a platinum supporter of ITC and a sponsor of the 50th Celebration on the evening of November 12 and the Test Technology Technical Council’s (TTTC) Automotive Reliability and Test (ART) Workshop.