Search results for "advantest"
Power supply test card in demand at processor makers
Semiconductor test equipment supplier Advantest says that its DC Scale XPS256 Device Power Supply (DPS) card, developed for use with the V93000 EXA Scale SoC test system, is now ramping to production-volume test at leading makers of communications processors.
Advantest lines up raft of new products at SEMICON Japan
More than a dozen of Advantest’s latest test solutions and products will be on show at the first-ever virtual SEMICON Japan (December 14-17) where once again the company will be a gold-level sponsor.
Cloud solutions boost efficiencies for IC designs
Working with its partner PDF Solutions, Advantest has introduced two new innovative cloud-based software solutions: the Advantest V93000 Dynamic Parametric Test (DPT) system powered by PDF Exensio DPT, and an edge high performance compute (HPC) system.
CMOS image capture module tests D-PHY and C-PHY ICs
A high-speed CMOS image capture module for its T2000 test platform that enables highly parallel, 64-site testing of both D-PHY and C-PHY devices for the rapidly growing smart phone market has been introduced by Advantest.
General-purpose hardware units compatible with T2000
Advantest has introduced two new general-purpose hardware instruments – the 500MDM digital module and the DPS32A power supply module – to boost the capabilities of its T2000 test platform for a variety of applications such as system-on-a-chip (SoC) devices, power-management ICs, automotive devices and CMOS image sensors for the growing digital transformation market.
Advantest, STMicro collaborate on automated test cell
Advantest and STMicroelectronics have jointly developed an advanced, fully-automated final-test cell system that improves overall equipment efficiency and quality in semiconductor test and packaging operations.
Advantest issues VOICE 2021 call for papers
Semiconductor test equipment supplier Advantest has issued an international call for papers for its VOICE 2021 Developer Conference focusing on leading-edge technologies and future trends.
Advanced automated test cell for IC testing
Advantest and STMicroelectronics have announced that they have jointly developed an advanced, fully-automated final-test cell system that improves overall equipment efficiency and quality in semiconductor test and packaging operations. The pilot system has been deployed at ST’s back-end fab in Muar, Malaysia.
Test solutions on parade at Flash Memory Summit
The latest storage and memory test solutions will be displayed by Advantest at the virtual Flash Memory Summit, North America’s largest solid-state storage conference (November 10-12).
Test platform meets exascale computing challenges
Semiconductor test equipment supplier Advantest has introduced its next-generation V93000 testers targeted at advanced digital ICs up to the exascale performance class.