Search results for "advantest"
Two modules and a test head enhance SoC test platform
Two new modules and a test head designed specifically for high-volume testing of devices used in automotive applications have been added to Advantest’s T2000 platform. The new equipment is designed to enhance test coverage, enable higher parallelism and reduce the cost of test for system-on-chip (SoC) devices used in automobiles, a market segment that is projected to have a 9.6% compound annual growth rate from 2019 to 2022.
Episode #2 - productronica 2019 Round-up
Despite the poor weather, visitors poured into productronica to witness the latest innovations in product equipment and test and measurement instrumentation, alongside developments in materials and solvents. Kicking off productronica this year, Keysight Technologies launched a new product in the form of their latest in-circuit testers.
Alternative silicon validation on show at RADECS 2019
CloudTesting Services (CTS) will be featured by Advantest at RADECS 2019, the annual European forum for presenting and discussing the latest advances in the field of radiation effects on electronic and photonic materials, devices, circuits, sensors and systems.
Advantest wins Bosch supplier plaudit
Semiconductor test equipment supplier Advantest has received a Bosch Group Global Supplier Award for 2019, earning a global ranking among Bosch’s best providers of technology and services. Advantest received the award in recognition of its timely delivery of semiconductor test solutions used to qualify Bosch’s product portfolio of MEMs and automotive consumer devices.
Memory test solution to feature at Flash Summit 2019
Storage and memory test solutions, including the debut of its MPT3000ARC test system will be showcased at Flash Memory Summit 2019 in Santa Clara, California (August 6-8).
Tester accommodates a wide range of SSD form factors
Developed to test and debug solid-state drives (SSD), the MPT3000ARC system is the newest member of Advantest’s MPT3000 product family. The fully integrated MPT3000ARC can operate over a broad temperature range to test all SSDs used in rapidly multiplying applications, including connected devices from smart cars to wearable electronics.
mmWave ATE solution debuts at SEMICON West 2019
A debut for its V93000 Wave Scale Millimeter solution will be one of the highlights on the Advantest stand at SEMICON West 2019 in San Francisco (July 9-11). Software tools and services will also be showcased alongside the company’s memory test platforms.
Duo collaborate on digital high-speed interface test solution
Semiconductor test equipment supplier Advantest has partnered with MultiLane to develop instrumentation that extends the V93000 platform’s ability to cost-effectively test the next generation of digital high-speed interfaces.
Advantest signs up to UNGC
Semiconductor test equipment supplier Advantest has joined the Global Compact (UNGC), a global initiative of the United Nations, and the Global Compact Network Japan, a local network based in Japan. The UNGC is a special initiative of the UN Secretary-General which encourages companies and organisations to exert responsible and creative social leadership and to participate in creating a global framework for sustainable growth.
Software bridges route from DfT to ATE
A software bridge, dubbed SmartShell has been introduced by Advantest to enable direct communication between any of its V93000 single scalable platform testers and electronic design automation (EDA) environments such as Tessent Silicon Insight software from Mentor.