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A memory tester that combines the capabilities to perform both burn-in and memory-cell testing for advanced DRAMs and LPDDR (low-power, double-data-rate) devices has been launched by Advantest.

Advantest has postponed its VOICE 2020 Developer Conference in Scottsdale, Arizona due to health and safety concerns over the COVID-19 pandemic.

Semiconductor test equipment supplier Advantest will feature its newest test solutions for advanced ICs at SEMICON Korea in Seoul, South Korea (February 5-7). In addition to high-speed memory test solutions, Advantest will exhibit a wide range of products and solutions that contribute to the 5G revolution and accelerate the development of other applications such as ADAS/autonomous driving, IoT/smart devices and AI.

Keynote speakers for the Advantest VOICE 2020 Developer Conference in the U.S. and China have been announced. The conference will return to two popular locations – Scottsdale, Arizona on May 12-13 and Shanghai, China on May 22 – with the theme “Your Voice. Your Vision. Our Value.”

Semiconductor test equipment supplier Advantest will exhibit a wide variety of its latest products and solutions at SEMICON Japan 2019 (December 11-13) at Tokyo Big Sight. Advantest’s exhibit will address the test challenges of advanced ICs that make 5G communication a reality and accelerate the development of other cutting-edge applications, from AI/machine learning and smart manufacturing to smart cities.

The European debut of Advantest’s V93000 Wave Scale Millimeter test solution will take place at SEMICON Europa in Munich (November 12-15). It extends the capabilities of the V93000 system to cost-efficiently test the next generation of 5G-NR radio frequency devices and modules on a single scalable platform.

Hardware, software and online test solutions will be presented by Advantest at the 2019 International Test Conference (ITC) in Washington D.C. (November 12-14). It will also supply paper, panel and poster contributions. Advantest is a platinum supporter of ITC and a sponsor of the 50th Celebration on the evening of November 12 and the Test Technology Technical Council’s (TTTC) Automotive Reliability and Test (ART) Workshop.

Two new modules and a test head designed specifically for high-volume testing of devices used in automotive applications have been added to Advantest’s T2000 platform. The new equipment is designed to enhance test coverage, enable higher parallelism and reduce the cost of test for system-on-chip (SoC) devices used in automobiles, a market segment that is projected to have a 9.6% compound annual growth rate from 2019 to 2022.

Despite the poor weather, visitors poured into productronica to witness the latest innovations in product equipment and test and measurement instrumentation, alongside developments in materials and solvents. Kicking off productronica this year, Keysight Technologies launched a new product in the form of their latest in-circuit testers.

CloudTesting Services (CTS) will be featured by Advantest at RADECS 2019, the annual European forum for presenting and discussing the latest advances in the field of radiation effects on electronic and photonic materials, devices, circuits, sensors and systems.