Search results for "advantest"

Advantest Corporation and W2BI have reached an agreement in principle that Advantest will acquire W2BI, a provider of system level test automation software focusing on wireless communications. Based in New Jersey, W2BI will become a fully-owned subsidiary of Advantest’s US subsidiary, Advantest America. The acquisition is scheduled for finalization in May 2013, pending the completion of all required procedures.

Advantest has earned the Texas Instruments 2012 Supplier Excellence Award. Advantest provides the M4841 pick-and-place test handler, which TI uses with its installed automated test equipment. This is the first time that Advantest has received this supplier award from TI. Advantest has installed M4841 Dynamic Test Handlers at TI’s manufacturing facilities around the world. The versatile handler’s universal compatibility enables it to enhance t...

Advantest has entered the high-growth market for testing micro-electromechanical system (MEMS)-based sensors by installing V93000 Smart Scale systems at several of Freescale Semiconductor’s facilities around the world.

VOICE 2013, a user group meeting and partners conference organized by Advantest Corporation will include a robust technical program with papers from users of the T2000, V93000 and handlers. The event, to be held April 23-25 in San Jose, California, is an international forum for sharing technical content and exchanging perspectives on the latest semiconductor testing techniques and best practices.

Advantest Corporation today announced that the company has installed the first evaluation unit of its new test cell at Marvell, integrating the company’s T2000 Enhanced Performance Package (EPP) and its M4841 Dynamic Test Handler.

VOICE 2013 is an international conference focusing on innovative test solutions for system-on-chip and memory semiconductor devices and handler solutions. The 2013 conference will include technical presentations, new product kiosks, interactive discussion sessions for users of the T2000, V93000 and memory test platforms and test cell solutions, offering extensive networking and learning opportunities for all attendees. A new addition to the progr...

Advantest Corporation has introduced its new Multi-Vision Metrology Scanning Electron Microscope, the Wafer MVM-SEM E3310, which measures fine-pitch patterns on a wide range of wafer types with unparalleled accuracy, utilizing Advantest’s proprietary electron beam scanning technology.

Advantest has introduced its new T2000 8GDM to address the test requirements of system-on-chip devices with high-speed serial, parallel and memory interfaces such as PCI-Express and double data rate connections. The new module will be featured in Advantest’s exhibit (booth #8C-901 in Hall 8) at the SEMICON Japan trade show, December 5-7 in Makuhari Messe in the Chiba prefecture.

Advantest has announced that it has developed a new EB (electron beam) lithography system, the F7000, with superior resolution performance meeting the requirements for 1Xnm technology nodes. The F7000 supports substrates of diverse materials, sizes, and shapes, including nanoimprint templates as well as wafers, and is optimized for diverse applications such as advanced LSIs, photonics, MEMS, and other nano-processes.

Advantest has introduced its new T2000 Integrated Massive Parallel test solution (IMS), a massive parallel test system capable of achieving the lowest cost of test for microcontroller units with integrated analog and embedded flash memory circuits.