Search results for "advantest"
Advantest and Galaxy Partner to Improve OEE with New Test Floor Intelligence Software Solutions
Advantest Corporation and Galaxy Semiconductor Solutions have entered a joint development and distribution agreement for Advantest’s new Test Floor Intelligence software solutions. Advantest and Galaxy will cooperate to deliver advanced test-floor management systems that monitor and optimize test processes for both systems- and device-related issues, helping customers improve their overall equipment effectiveness. Advantest’s TFI software sol...
Advantest Introduces New Test Floor Intelligence Software Solution
Advantest Corporation has introduced its newest Test Floor Intelligence software solution, TFI 2.0, designed to improve the overall equipment effectiveness of production test operations by efficiently mining and analyzing the large volume of data generated during semiconductor testing.
Advantest’s VOICE 2013 Conference Attracts Over 300 Attendees
The 2013 edition of the VOICE annual Users Group Conference organized by Advantest and a committee of partner companies, attracted over 300 test engineers and managers from 43 companies to San Jose, California, on April 23-24. This year’s event set a new record for registered attendees with many of them travelling from various locations in the United States, Canada, Europe, Israel, Asia and Japan.
Advantest Acquires System Level Test Automation Software Provider W2BI
Advantest Corporation and W2BI have reached an agreement in principle that Advantest will acquire W2BI, a provider of system level test automation software focusing on wireless communications. Based in New Jersey, W2BI will become a fully-owned subsidiary of Advantest’s US subsidiary, Advantest America. The acquisition is scheduled for finalization in May 2013, pending the completion of all required procedures.
Advantest Earns Supplier Excellence Award From Texas Instruments
Advantest has earned the Texas Instruments 2012 Supplier Excellence Award. Advantest provides the M4841 pick-and-place test handler, which TI uses with its installed automated test equipment. This is the first time that Advantest has received this supplier award from TI. Advantest has installed M4841 Dynamic Test Handlers at TI’s manufacturing facilities around the world. The versatile handler’s universal compatibility enables it to enhance t...
Advantest Enters MEMS Testing Market with Multiple System Installations at Freescale Semiconductor’s Facilities in Arizona and Asia
Advantest has entered the high-growth market for testing micro-electromechanical system (MEMS)-based sensors by installing V93000 Smart Scale systems at several of Freescale Semiconductor’s facilities around the world.
Advantest VOICE 2013 Conference to Feature High Quality Presentations for SOC Platforms and Handlers
VOICE 2013, a user group meeting and partners conference organized by Advantest Corporation will include a robust technical program with papers from users of the T2000, V93000 and handlers. The event, to be held April 23-25 in San Jose, California, is an international forum for sharing technical content and exchanging perspectives on the latest semiconductor testing techniques and best practices.
Advantest’s New Test Cell Selected by Marvell Semiconductor to Reduce Cost of Test for High-volume, Cost-sensitive ICs
Advantest Corporation today announced that the company has installed the first evaluation unit of its new test cell at Marvell, integrating the company’s T2000 Enhanced Performance Package (EPP) and its M4841 Dynamic Test Handler.
VOICE 2013 User’s Conference for SoC & Memory Semiconductor Devices & Handler Test Technologies
VOICE 2013 is an international conference focusing on innovative test solutions for system-on-chip and memory semiconductor devices and handler solutions. The 2013 conference will include technical presentations, new product kiosks, interactive discussion sessions for users of the T2000, V93000 and memory test platforms and test cell solutions, offering extensive networking and learning opportunities for all attendees. A new addition to the progr...
Advantest Introduces New Wafer MVM-SEM Tool E3310
Advantest Corporation has introduced its new Multi-Vision Metrology Scanning Electron Microscope, the Wafer MVM-SEM E3310, which measures fine-pitch patterns on a wide range of wafer types with unparalleled accuracy, utilizing Advantest’s proprietary electron beam scanning technology.