Search results for "advantest"
Test modules meet wide-range modulation challenges
Advantest has introduced two new test modules for high-speed, cost-efficient testing of radio-frequency (RF) ICs used in cell phones and wireless LAN devices built to meet 802.11ac and LTE-Advanced mobile communication standards. Both the 32-port WLS32-A module and the 16-port WLS16-A module are fully compatible with Advantest’s T2000 platform.
Digital channel card offers data rates up to 16Gbps
Advantest’s latest digital channel card is the Pin Scale Serial Link (PSSL) for at-speed characterisation and volume production of high-speed semiconductors. PSSL is capable of data rates up to 16 Gbps. It extends the speed and performance capabilities of Advantest’s previous Pin Scale cards to enable affordable, at-speed testing of high-end ICs.
Next generation of memory ICs get test upgrade
Advantest now has a test solution for next-generation memory ICs that enable high-demand mobile applications and servers. With its highly parallel testing capabilities and full compatibility as an upgrade on Advantest’s widely used T5503 test platform, the new T5503HS offers high productivity and low cost of test within an upgradable design.
Module lowers cost of advanced CMOS image testing
Advantest’s T2000 ISS IPE2 image-processing test module has been developed to apply greater image-processing capabilities to test today’s CMOS image sensors at higher throughput and lower cost. Advanced CMOS image sensors (CIS) are used extensively in today’s smart phones, tablet computers, digital cameras, video camcorders and other high-volume electronic products.
Smart Scale platform tests optical transceivers for Avago
Avago Technologies’ Fiber Optic Products Divisionhas purchased a V93000 Smart Scale platform from Advantest for use in testing optical transceiver devices for high-speed backplane and telecommunication applications. With a compact footprint, flexible performance and advanced features including digital channel pins for DC testing, the V93000 Smart Scale platform meets Avago’s requirements.
Toyota installs IPS to test power ICs for hybrid cars
Advantest has installed its T2000 Integrated Power Device Test Solution at Toyota for evaluating and mass-producing integrated power ICs used in next-generation hybrid cars. Toyota selected the T2000 IPS unit as an essential test system to enhance the safety and reliability of vehicle-mounted devices.
High-performance test handler for SoC devices
Advantest have unveiledthe field-upgradable M4871 pick-and-place system. The company's latest test handler for system-on-chip devices, it integrates Advantest’s proven technology from existing product lines with advanced, new functionality including visual alignment with high throughput, and active thermal control using Advantest’s Tri-Temp capability.
Automated Test Equipment in the Cloud
A revolutionary pay-per-use solution combines semiconductor test with cloud computing technology, offering semiconductor companies access to test capabilities while minimising investment and effort. Stephane Cavazzini, Advantest’s Sales Account Manager for SOC IDM, explores further in this ES Design magazine article.
productronica: Cloud clears way to IC testing
Advantest has brought cloud computing technology to the test arena. At productronica the company launched the CloudTesting Service (CTS) aimed at design verification engineers, fabless companies, educational and research institutes with limited resources and distributors. IC prototype testing, debugging and troubleshooting are all covered by the new service.
Multi-Site Testing Solution Targets Mobile Power-Management ICs
Advantest has entered the market for testing system-on-chip (SoC) mobile power-management ICs (PMIC) using the V93000 platform. Compatible with Advantest’s base of V93000 systems, the new solution can perform multi-site testing of complex SoC devices and single in-line packages (SiP) with embedded power-management cores.