Search results for "advantest"

Advantest has unveiled the first member of its NEO-SSD family of products for testing advanced solid-state drives (SSDs). The MPT3000 system enables accelerated SSD product development and faster time-to-manufacturing ramp. The system improves users’ engineering efficiency through powerful, easy to use software tools and a multi-protocol hardware architecture.

A 1.6 GBit per second digital module from Advantest incorporates a new feature called Functional Test Abstraction Plus (FTA+) to achieve protocol-aware testing in which the tester communicates directly with the devices under test (DUT) in each IC’s protocol language. Advantest says that the T2000 digital module will improve efficiency in testing system-on-chip (SoC) devices on the T2000 test platform.

An evolutionary value-added platform that combines digital and analogue testing capabilities to handle small-pin-count analogue, mixed-signal and sensor semiconductors has been unveiled by Advantest. The EVA100’s expandable architecture provides the flexibility to conduct a wide range of measurement functions.

Advantest’s terahertz power meter, the TAS5500 is a basic measurement instrument that computes the strength of terahertz waves by detecting the heat generated when these waves are absorbed by matter. This enables input power to be measured to ±8% accuracy.The measurement accuracy is based on the Japanese national standard for infrared power measurement, recalibrated for the terahertz region with measurement data accumulated by Advant...

B&B Electronics has appointed Gary Sheedy as the General Manager of its EMEA operations based in Galway, Ireland. Mr. Sheedy will manage the EMEA sales teams and have P&L responsibility for the EMEA operation. He will also take on an international business development role for B&B Electronics, drawing from his two decades of high-tech industry experience on the international stage.

VOICE, the annual developer conference hosted by Advantest, will continue its tradition of offering a dynamic technical program in 2014 with a record number of papers presented in two locations – May 12-13 in Silicon Valley, California at the Hyatt Regency Santa Clara, and May 15-16 in Austin, Texas at the Radisson Hotel & Suites Austin Downtown.

Advantest has extended its V93000 capabilities with the DPS128HV module, a high-density device power supply (DPS) unit designed to handle a wide range of operating voltages for testing devices such as eFlash memory ICs. With the new module, Advantest’s V93000 test platform can be easily scaled from low-channel to high-channel configurations to provide the most economical test solution for each specific device under test.

Advantest has introduced two new test modules for high-speed, cost-efficient testing of radio-frequency (RF) ICs used in cell phones and wireless LAN devices built to meet 802.11ac and LTE-Advanced mobile communication standards. Both the 32-port WLS32-A module and the 16-port WLS16-A module are fully compatible with Advantest’s T2000 platform.

Advantest’s latest digital channel card is the Pin Scale Serial Link (PSSL) for at-speed characterisation and volume production of high-speed semiconductors. PSSL is capable of data rates up to 16 Gbps. It extends the speed and performance capabilities of Advantest’s previous Pin Scale cards to enable affordable, at-speed testing of high-end ICs.

Advantest now has a test solution for next-generation memory ICs that enable high-demand mobile applications and servers. With its highly parallel testing capabilities and full compatibility as an upgrade on Advantest’s widely used T5503 test platform, the new T5503HS offers high productivity and low cost of test within an upgradable design.