Search results for "advantest"
Engineering station enhances SSD test support
Advantest has added to its MPT3000 family for testing advanced solid-state drives (SSDs) by launching the MPT3000ES engineering station. The new station features a small footprint configured to test up to eight SSDs in parallel. The system’s small size and ability to plug into a standard AC outlet enable users to conduct program development and interactive device debugging in either office or lab settings.
Floating power source opens way to test high voltage ICs
Advantest has extended the capabilities of its V93000 test platform for high-voltage and high-current testing of embedded power devices. It has launched the PVI8 floating power source, which gives the V93000 sufficient power and enough analogue and digital channels on a single platform to conduct highly parallel, cost-efficient testing of embedded power ICs.
Test module handles MPUs, ASICs, FPGAs
Advantest has announced its new T2000 Enhanced Device Power Supply 150A (DPS150AE) module that enables its T2000 test platform to handle the load requirements for highly accurate testing of both high-current and low-voltage semiconductors, including microprocessor units (MPUs), application-specific ICs (ASICs) and field-programmable gate arrays (FPGAs).
Test solution accelerates SSD time to market
Advantest has unveiled the first member of its NEO-SSD family of products for testing advanced solid-state drives (SSDs). The MPT3000 system enables accelerated SSD product development and faster time-to-manufacturing ramp. The system improves users’ engineering efficiency through powerful, easy to use software tools and a multi-protocol hardware architecture.
Digital module EDA link boosts SoC testing
A 1.6 GBit per second digital module from Advantest incorporates a new feature called Functional Test Abstraction Plus (FTA+) to achieve protocol-aware testing in which the tester communicates directly with the devices under test (DUT) in each IC’s protocol language. Advantest says that the T2000 digital module will improve efficiency in testing system-on-chip (SoC) devices on the T2000 test platform.
Platform tests analogue, mixed-signal, sensor ICs
An evolutionary value-added platform that combines digital and analogue testing capabilities to handle small-pin-count analogue, mixed-signal and sensor semiconductors has been unveiled by Advantest. The EVA100’s expandable architecture provides the flexibility to conduct a wide range of measurement functions.
Terahertz power meter measures to +/- 8% accuracy
Advantest’s terahertz power meter, the TAS5500 is a basic measurement instrument that computes the strength of terahertz waves by detecting the heat generated when these waves are absorbed by matter. This enables input power to be measured to ±8% accuracy.The measurement accuracy is based on the Japanese national standard for infrared power measurement, recalibrated for the terahertz region with measurement data accumulated by Advant...
B&B appoints GM of EMEA Operations
B&B Electronics has appointed Gary Sheedy as the General Manager of its EMEA operations based in Galway, Ireland. Mr. Sheedy will manage the EMEA sales teams and have P&L responsibility for the EMEA operation. He will also take on an international business development role for B&B Electronics, drawing from his two decades of high-tech industry experience on the international stage.
Advantest VOICE 2014 Conference to feature more than 100 papers
VOICE, the annual developer conference hosted by Advantest, will continue its tradition of offering a dynamic technical program in 2014 with a record number of papers presented in two locations – May 12-13 in Silicon Valley, California at the Hyatt Regency Santa Clara, and May 15-16 in Austin, Texas at the Radisson Hotel & Suites Austin Downtown.
Power supply unit extends memory IC test options
Advantest has extended its V93000 capabilities with the DPS128HV module, a high-density device power supply (DPS) unit designed to handle a wide range of operating voltages for testing devices such as eFlash memory ICs. With the new module, Advantest’s V93000 test platform can be easily scaled from low-channel to high-channel configurations to provide the most economical test solution for each specific device under test.