Search results for "advantest"

The MPT3000 family of test solutions for advanced solid state drives (SSDs) will takje centre stage for Advantest at the Flash Memory Summit (Aug 11-13) in Santa Clara, California. Advantest is an Emerald sponsor of this year’s tenth annual Summit. Designed to help accelerate SSD product development and achieve faster time to market, the multi-protocol MPT3000 platform will be featured during the Summit’s exhibition days of August 12-...

Advantest has announced firmware that enables all MPT3000 systems to test Serial Attached SCSI (SAS) 12G and Serial ATA (SATA) 6G SSDs, making this tester the first true single-system solution for testing SAS, SATA and PCIe protocol SSDs. The addition of SAS and SATA to the proven support for PCIe 3.0, NVMe and AHCI extends the platform’s test coverage to include SSDs that use any of today’s major protocol standards.

Downloadable firmware that enables all MPT3000 systems to test Serial Attached SCSI (SAS) 12G and Serial ATA (SATA) 6G solid-state drives (SSDs) has been released by Advantest. The company says that it makes the tester the first true single-system solution for testing SAS, SATA and PCIe protocol SSDs.

A full range of test solutions designed to enable the Internet of Things (IoT) including automatic test equipment (ATE), terahertz measurement systems, multi-vision scanning-electron microscopes (SEM) and an e-beam lithography system will be demonstrated by Advantest at SEMICON West 2015 in San Francisco (July 14-16).

The VOICE 2015 Developer Conference organised by Advantest became a truly international forum last month by holding the event in both Santa Clara, California and Shanghai, China – the first time that this annual gathering of test equipment users, suppliers and partners has been held outside the United States.

A battery life test solution that will meet UE acceptance is being developed by Keysight Technologies and W2BI, an Advantest Group company. The test solution was developed in accordance with a number of test cases as defined within CTIA Battery Life Test Plan rev 1.0 and TS.09-v7.6.

The new T5833 system from Advantest is a cost-efficient, high-volume test solution capable of performing both wafer sort and final test of DRAM and NAND flash memory devices. Shipments to customers are beginning this month. Amid surging sales of mobile electronics, DRAMs, NAND flash memories and multi-chip packages (MCPs) — the main device types used in smart phones and tablets — are quickly evolving toward higher speeds and greater d...

A technology that utilises short-pulse terahertz waves for analysis of electrical circuits has been developed by Advantest. The technology has 2 major applications – analysis of the transmission characteristics (S parameters) of devices using the sub-terahertz band (100GHz~1THz), and characterisation and location of failures in chip circuits (TDT/TDR).

Advantest’s annual VOICE Developer Conference kicks off on May 12 in Silicon Valley, California and May 22 in Shanghai, China. VOICE will include technical presentations, a partners’ expo, and interactive discussion sessions for users of the V93000 and T2000 SoC test platforms, as well as Advantest handlers and test cell solutions, offering extensive learning and networking opportunities for all attendees.

Advantest will showcase its broad product portfolio, including its semiconductor test solutions, nanotechnology products and terahertz systems at SEMICON China (March 17-19) The show will be held at the Shanghai New International Expo Centre.