Search results for "advantest"
Short-pulse terahertz waves technology used for chip circuit analysis
A technology that utilises short-pulse terahertz waves for analysis of electrical circuits has been developed by Advantest. The technology has 2 major applications – analysis of the transmission characteristics (S parameters) of devices using the sub-terahertz band (100GHz~1THz), and characterisation and location of failures in chip circuits (TDT/TDR).
Test conference slated for California and China
Advantest’s annual VOICE Developer Conference kicks off on May 12 in Silicon Valley, California and May 22 in Shanghai, China. VOICE will include technical presentations, a partners’ expo, and interactive discussion sessions for users of the V93000 and T2000 SoC test platforms, as well as Advantest handlers and test cell solutions, offering extensive learning and networking opportunities for all attendees.
Semiconductor test solutions on parade at China show
Advantest will showcase its broad product portfolio, including its semiconductor test solutions, nanotechnology products and terahertz systems at SEMICON China (March 17-19) The show will be held at the Shanghai New International Expo Centre.
Cloud testing has a DATE in Grenoble
Advantest will showcase its CloudTesting solutions from its group company, Cloud Testing Service at DATE 2015 at the ALPEXPO-ALPES Congress in Grenoble (March 9-13). Backed by Advantest’s 60-year history of measurement technology and innovation, CTS solutions offer the latest high-quality test methods utilising IPs, characterization tools, analysis and more.
Handler enables memory testing productivity gains
Advantest has combined improved positioning accuracy higher throughput and tighter temperature control in its new M6245 test handler. The system incorporates the company’s latest advances for handling double data rate (DDR) and Flash memory devices. The test handler incorporates a visual-alignment system that improves test yields by achieving contact accuracy to within 0.3 mm ball pitch.
PMU module improves high-level measurement accuracy
Advantest has launched a new multi-purpose parametric measurement unit (PMU) module, the T2000 PMU32E, to enhance its T2000 platform’s capabilities in testing digital, analogue and power-management system-on-chip (SoC) devices. The new high-density, 32-channel module is fully compatible with Advantest’s original PMU32 module – even using the same tester interface unit (TIU) – while offering twice the resolution and accurac...
Tester addresses advanced display driver IC trends
There are three key trends in testing the next generation of display driver ICs that control high resolution LCD panels, and Advantest has launched its new T6391 system to meet these requirements. The new tester will address the growing number of pins on display driver devices, the increasing speeds of interfaces and highly integrated multi-functions – all of which contribute to higher resolution displays.
Let your voice be heard at VOICE
Advantest is once again offering engineers and designers the chance to participate at its VOICE 2015 annual Advantest Developer Conference. The test equipment supplier has issued an international call for papers focusing on innovative test solutions for system-on-chip (SoC) and memory semiconductor devices and handler solutions.
E-beam lithography tool debuts at Semicon Europa
Advantest is preparing to exhibit its broad portfolio, including its nanotechnology products, terahertz systems and semiconductor test solutions at SEMICON Europa in Grenoble (October 7-9). It will highlight its multi-vision CD-SEM metrology solutions and newest e-beam lithography tool.
Metrology system analyses semiconductor packaging
Advantest has a new mold thickness metrology system, the TS9000, for measuring the thickness of semiconductor packaging. The system is based on advances in Terahertz (THz) technology pioneered by Advantest. The TS9000 Mold Thickness Analysis (MTA) System is a new metrology tool that performs non-destructive analysis of the thickness of semiconductor packaging.