Search results for "advantest"
High speed memory test card supports up to 16Gb/s
Advantest has introduced the fastest fully integrated memory test card in history, the HSM16G. The card extends the high-speed testing capabilities of the company’s V93000 HSM series of testers to native 16Gb/s for at-speed testing of ultra-fast memory ICs. Advantest's ATE solution supports device engineering, debugging and volume production of today’s highest speed GDDR5 and future GDDR5X ICs, with parallel data busses up to 16Gb/s.
Solid state drive deal opens door to subcontract test
Advantest has entered a strategic partnership with Universal Scientific Industrial (Shanghai) (USI), a member of the ASE Group of companies, to offer the first dedicated outsourced assembly and test (OSAT) services to the growing market for solid-state drives (SSDs). This collaboration allows SSD manufacturers to test their designs and devices on the advanced MPT3000 test platform while minimising up-front capital investment by outsourcing test a...
Test solutions centre stage at Intel Developers Forum
The Intel Developers Forum will see Advantest showcase its test solutions for emerging market segments including the Internet of Things (IoT) and wearable electronics. The new T5833 and proven T5831 memory testers, which are built on Advantest’s modular AS Platform will be centre stage at the Forum (August 18-20) in San Francisco.
SSD test solution on parade at Flash Memory Summit
The MPT3000 family of test solutions for advanced solid state drives (SSDs) will takje centre stage for Advantest at the Flash Memory Summit (Aug 11-13) in Santa Clara, California. Advantest is an Emerald sponsor of this year’s tenth annual Summit. Designed to help accelerate SSD product development and achieve faster time to market, the multi-protocol MPT3000 platform will be featured during the Summit’s exhibition days of August 12-...
Single-system testing for SAS, SATA & PCIe protocol SSDs
Advantest has announced firmware that enables all MPT3000 systems to test Serial Attached SCSI (SAS) 12G and Serial ATA (SATA) 6G SSDs, making this tester the first true single-system solution for testing SAS, SATA and PCIe protocol SSDs. The addition of SAS and SATA to the proven support for PCIe 3.0, NVMe and AHCI extends the platform’s test coverage to include SSDs that use any of today’s major protocol standards.
Firmware extends SSD testing to SCSI 12G and SATA 6G
Downloadable firmware that enables all MPT3000 systems to test Serial Attached SCSI (SAS) 12G and Serial ATA (SATA) 6G solid-state drives (SSDs) has been released by Advantest. The company says that it makes the tester the first true single-system solution for testing SAS, SATA and PCIe protocol SSDs.
IoT test solutions debut at Semicon West
A full range of test solutions designed to enable the Internet of Things (IoT) including automatic test equipment (ATE), terahertz measurement systems, multi-vision scanning-electron microscopes (SEM) and an e-beam lithography system will be demonstrated by Advantest at SEMICON West 2015 in San Francisco (July 14-16).
Test conference steps on to international stage
The VOICE 2015 Developer Conference organised by Advantest became a truly international forum last month by holding the event in both Santa Clara, California and Shanghai, China – the first time that this annual gathering of test equipment users, suppliers and partners has been held outside the United States.
Battery life test solution set to meet UE acceptance
A battery life test solution that will meet UE acceptance is being developed by Keysight Technologies and W2BI, an Advantest Group company. The test solution was developed in accordance with a number of test cases as defined within CTIA Battery Life Test Plan rev 1.0 and TS.09-v7.6.
DRAM, NAND flash memory test costs cut
The new T5833 system from Advantest is a cost-efficient, high-volume test solution capable of performing both wafer sort and final test of DRAM and NAND flash memory devices. Shipments to customers are beginning this month. Amid surging sales of mobile electronics, DRAMs, NAND flash memories and multi-chip packages (MCPs) — the main device types used in smart phones and tablets — are quickly evolving toward higher speeds and greater d...