Search results for "advantest"

The latest model of its EVA100 measurement system, the high-throughput EVA100 Production Model designed for volume production of sensors, low-pin-count analogue ICs and mixed-signal ICs has been introduced by Advantest. Fully compatible with the initial EVA100 system introduced last year, the new Production Model allows users to establish a standardised measurement environment from design evaluation through production, dramatically improving thei...

A new TDR Option for Advantest’s TS9000 series of terahertz analysis systems has been released. It enables analysis of circuit quality in semiconductors, printed substrates, electronic components, and other applications, utilising short-pulse terahertz waves.

An international call for papers on semiconductor test solutions, best practices and innovative technologies has been issued for next year’s tenth annual VOICE Developer Conference, organised by Advantest. Based on the success of holding VOICE sessions in China and the U.S. last year, the 2016 conference will again be held on both sides of the Pacific Ocean – in San Diego, California on May 10-11 and in Hsinchu, Taiwan on May 18 &ndas...

A full line of test solutions for automotive, communications and consumer devices will be shown by Advantest together with its metrology and advanced E-beam lithography systems at SEMICON Europa Dresden (October 6-8). Visitors will be able to learn more about the V93000 platform’s capabilities in improving time to quality (TTQ) in multi-site radio-frequency (RF) applications and testing IoT devices.

Hardware and online test solutions will be demonstrated by Advantest at the International Test Conference (ITC) in Anaheim, California (Oct 6-8). The company will also present several papers at the associated conference. There will be live demonstrations of Advantest’s on-demand CloudTesting Service and its EVA100 tester for analogue, mixed-signal and sensor ICs.

EB (electron beam) lithography and MVM-SEM (Multi-Vision Metrology Scanning Electron Microscope) solutions will be showcased by Advantest at the 41st Micro and Nano Engineering Show in The Hague (Sept 21-24). Highlighted products include theF7000 EB lithography system for direct writing of nano-patterns on wafers, the E3310 and E3640 MVM-SEM systems for wafer and mask metrology and the E5610 DR (defect review)-SEM for inspecting next-generation p...

DA-Integrated has installed a V93000 Smart Scale SoC test system from Advantest. DA-Integrated’s selection of the V93000 Smart Scale system is based on the tester’s high performance and scalability, its widespread use at outsourced semiconductor assembly and test foundries and its compatibility with the previous P1000 test system, legacy equipment from Advantest’s 2011 acquisition of ATE supplier Verigy.

Advantest has introduced the fastest fully integrated memory test card in history, the HSM16G. The card extends the high-speed testing capabilities of the company’s V93000 HSM series of testers to native 16Gb/s for at-speed testing of ultra-fast memory ICs. Advantest's ATE solution supports device engineering, debugging and volume production of today’s highest speed GDDR5 and future GDDR5X ICs, with parallel data busses up to 16Gb/s.

Advantest has entered a strategic partnership with Universal Scientific Industrial (Shanghai) (USI), a member of the ASE Group of companies, to offer the first dedicated outsourced assembly and test (OSAT) services to the growing market for solid-state drives (SSDs). This collaboration allows SSD manufacturers to test their designs and devices on the advanced MPT3000 test platform while minimising up-front capital investment by outsourcing test a...

The Intel Developers Forum will see Advantest showcase its test solutions for emerging market segments including the Internet of Things (IoT) and wearable electronics. The new T5833 and proven T5831 memory testers, which are built on Advantest’s modular AS Platform will be centre stage at the Forum (August 18-20) in San Francisco.