Search results for "advantest"
Tokyo date for pressure sensor test unit
The new HA7200 temperature and pressure stimulus unit, designed to apply the precise temperature and pressure required for final testing of pressure sensors has been unveiled by Advantest. Up to four sensors can be tested in a small chamber with the temperature controlled by the dual-fluid technology used on Advantest’s test handlers.
Debut makers lined up for SEMICON Japan
Advantest will have a prominent presence at the SEMICON Japan trade show (December 16-18) at the Tokyo Big Sight international exhibition centre. In addition to showcasing a wide spectrum of automatic test equipment (ATE) and presenting a technical paper, Advantest is a gold sponsor of this year’s event, which includes sponsoring the President’s Reception on December 16.
Tester takes on high performance flash devices
The T5851 system is designed to provide a cost-effective test solution for high-performance universal flash storage (UFS) devices and PCIe BGA solid-state drives (SSDs) – memory ICs in high demand by makers of low-power, mobile applications such as smart phones, tablets and ultra-portable laptops.
Test system streamlines chip & sensor production
The latest model of its EVA100 measurement system, the high-throughput EVA100 Production Model designed for volume production of sensors, low-pin-count analogue ICs and mixed-signal ICs has been introduced by Advantest. Fully compatible with the initial EVA100 system introduced last year, the new Production Model allows users to establish a standardised measurement environment from design evaluation through production, dramatically improving thei...
TDR option enhances semiconductor quality analysis
A new TDR Option for Advantest’s TS9000 series of terahertz analysis systems has been released. It enables analysis of circuit quality in semiconductors, printed substrates, electronic components, and other applications, utilising short-pulse terahertz waves.
Semiconductor test conference issues Call for Papers
An international call for papers on semiconductor test solutions, best practices and innovative technologies has been issued for next year’s tenth annual VOICE Developer Conference, organised by Advantest. Based on the success of holding VOICE sessions in China and the U.S. last year, the 2016 conference will again be held on both sides of the Pacific Ocean – in San Diego, California on May 10-11 and in Hsinchu, Taiwan on May 18 &ndas...
IoT test devices on parade at SEMICON Europa
A full line of test solutions for automotive, communications and consumer devices will be shown by Advantest together with its metrology and advanced E-beam lithography systems at SEMICON Europa Dresden (October 6-8). Visitors will be able to learn more about the V93000 platform’s capabilities in improving time to quality (TTQ) in multi-site radio-frequency (RF) applications and testing IoT devices.
Anaheim venue hosts hardware/online test solutions
Hardware and online test solutions will be demonstrated by Advantest at the International Test Conference (ITC) in Anaheim, California (Oct 6-8). The company will also present several papers at the associated conference. There will be live demonstrations of Advantest’s on-demand CloudTesting Service and its EVA100 tester for analogue, mixed-signal and sensor ICs.
EB lithography on parade in The Hague
EB (electron beam) lithography and MVM-SEM (Multi-Vision Metrology Scanning Electron Microscope) solutions will be showcased by Advantest at the 41st Micro and Nano Engineering Show in The Hague (Sept 21-24). Highlighted products include theF7000 EB lithography system for direct writing of nano-patterns on wafers, the E3310 and E3640 MVM-SEM systems for wafer and mask metrology and the E5610 DR (defect review)-SEM for inspecting next-generation p...
SoC test system offers high performance & scalability
DA-Integrated has installed a V93000 Smart Scale SoC test system from Advantest. DA-Integrated’s selection of the V93000 Smart Scale system is based on the tester’s high performance and scalability, its widespread use at outsourced semiconductor assembly and test foundries and its compatibility with the previous P1000 test system, legacy equipment from Advantest’s 2011 acquisition of ATE supplier Verigy.