Search results for "advantest"
'Ahead of what's possible' launches at electronica
Back at electronica this year, in Munich, Germany, Analog Devices, (ADI), will exhibita broad range of simplified solutions and innovative technologies across 6 application areas, and a total of 18 live demonstrations covering healthcare, instrumentation, process control, automotive, energy and Internet of Things.
Solid state drive testing shifts to single platform
The MPT3000HVM system has been developed by Advantest to provide a single platform to test the full range of SATA, SAS, and PCIe solid-state drives (SSDs), from the highest performance enterprise to the most cost-effective client SSDs. The system achieves this optimal production test solution by leveraging the proven MPT3000 tester-per-DUT (device under test) architecture and unique hardware acceleration in a new high-density configuration.
E-beam lithography system to feature at Vienna show
The F7000 EB (electron beam) lithography system will be the centerepice of Advantest’s stand at the Micro and Nano Engineering Show in Vienna (September 19-23). The system delivers high throughput and creates very accurate and smooth nano-patterns on wafers from 1X-nm resolutions.
Complete solution for measuring the dimensions of nanoscale patterns
Complete solution for measuring the dimensions of nanoscale patterns introduced byAdvantest and Digital Surf. They have announced that PM3D Map software based on Digital Surf’s industry-standard Mountains Technology is now incorporated into the company’s leading-edge Multi Vision Metrology Scanning Electron Microscope (MVM-SEM) series. Advantest’s MVM-SEM system together with PM3D Map software now provide a complete solution for...
Die-level handler tests ICs for high-growth applications
The HA1000 die-level handler is a cost-efficient test solution for determining known good dies (KGD) prior to IC packaging announced by Advantest. Economics is a driving factor in die-level testing. Determining a semiconductor device’s viability prior to packaging or building memory stacks is critical to avoiding rework, achieving high yields and lowering costs.
San Diego & Taiwan host semiconductor test conference
Dual sessions in the United States and Asia will be key features of Advantest’s 10th annual VOICE Developer Conference. Key players in the semiconductor test industry will get opportunities to hear more than 120 technical presentations, talk with experts at technology kiosks, visit the Partners’ Expo, attend networking events and conduct in-depth discussions relating to Advantest’s broad range of IC test solutions.
Test developer conference celebrates 10th anniversary
VOICE, the annual developer conference hosted by leading semiconductor test equipment supplier Advantest will celebrate its 10th anniversary in May with a comprehensive line-up of more than 120 technical presentations, technology kiosks, a Partners’ Expo, multiple networking events and opportunities for in-depth discussions about Advantest’s test platforms as well as handlers, test cell solutions and related technologies.
Versatile tester targets wide range of flash memories
The new T5830 memory tester is the latest member of Advantest’s T5800 product family, optimised for testing a wide range of flash memory devices used in mobile electronic devices. As portable applications are booming, the global market for flash-memory test systems is projected to reach $148 million by 2018, according to market analysis firm VLSIresearch.
Test solutions take the road to Shanghai
Test solutions for measuring the connected world – and everything in it – will be demonstrated by Advantest at the SEMICON China trade show in Shanghai (March 15-17). In addition to exhibiting, Advantest is sponsoring two events at the show - the Build China IC Manufacturing Ecosystem Forum and the China Semiconductor Technology International Conference (CSTIC).
Analogue pin module tests SoCs for IoT & mobiles
The DC Scale AVI64 module from Advantech is designed to give the V93000 single scalable platform the broadest application coverage on the market. Using Advantest’s innovative universal analog pin architecture, the 64-channel module extends the V93000 platform’s capabilities to include testing of power and analog ICs that enable smart, internet-connected electronics for the rapidly growing mobile, automotive and Internet of Things (IoT...