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Keithley Instruments GmbH Articles
Free Keithley Web-Based Seminar ExploresTechniques for Characterizing Non-Volatile Memory
Keithley Instruments will broadcast a free, web-based seminar titled “Non-Volatile Memory – Characterization and Measurement Techniques on Thursday, November 17, 2011. To register for this one-hour seminar, visit http://www.keithley.info/NonVolatileMemory. Efforts to develop alternative non-volatile memory (NVM) technologies to floating gate NAND flash memory are currently underway, such as phase-change memory (PCM/PRAM), ferro-electric memo...
Keithley Online Seminar Teaches Techniques for Making Error-Free Low I and High R Measurements
Keithley Instruments will broadcast a web-based seminar titled “Techniques for Making Optimal Low Current and High Resistance Measurements” on Tuesday, October 27, 2011 at 15:00 CEST (UTC/GMT: 13:00). To register for this event, visit www.keithley.info/lowIhighR Participants of the free seminar will learn basic techniques for making low current (1GΩ) measurements, which are required in a growing number of applications.
Keithley Publishes CD on High Performance Source Measurement Solutions
Keithley Instruments, Inc., Inc., a world leader in advanced electrical test instruments and systems, has published an informative CD entitled, “Configuring Cost-Effective, High Performance Sourcing and Measurement Solutions.” A free copy is available upon request from Keithley at: http://www.keithley.com/promo/pr/092
KeithleyCare Repair and Calibration Service Plans Cut Costs, Reduce Downtime, and Protect Instrument Investments
Keithley Instruments has introduced KeithleyCare Plans to provide owners of Keithley instrumentation with fast, high quality instrument calibration and repair services at a fraction of the cost of “per-event” service. KeithleyCare plan purchasers receive priority service on repairs and calibration, as well as minimize their equipment downtime, service costs, and administrative hassles.
Keithley Adds Support for Non-Volatile Memory, Very Low Frequency C V, and Increased Parallel Testing to Semiconductor Parameter Analyzer
Keithley Instruments has introduced a variety of enhancements for its award-winning Model 4200-SCS Semiconductor Characterization System. The Keithley Test Environment Interactive V8.2 upgrade includes new non-volatile memory test libraries and sample projects for a variety of emerging memory technologies. The upgrade also supports making very low frequency capacitance-voltage measurements, which are useful for characterizing device technologies ...
Keithley Launches New General Purpose Programmable Power Supply Product Line
Keithley Instruments, Inc., announced the availability of five new general-purpose programmable DC power supplies designed to complement the company’s existing line of specialty power supplies and source measurement instruments for component, module, and device characterization and test applications.
Keithley Expands Series 2400 SourceMeter® Family with Lower-Cost Solution Optimized for
Keithley Instruments, Inc. announced a low-cost addition to its popular Series 2400 SourceMeter instrument family. Like all of Keithley’s SMU (source measurement unit) instruments, the new Model 2401 SourceMeter instrument is optimized for high precision test applications such as current vs. voltage (I V) characterization of photovoltaic (solar) cells, high brightness LEDs (HBLEDs), low voltage materials, and semiconductor devices, as well as r...
Keithley Upgrades Semiconductor Test Software for High Throughput Wafer Production Test
Keithley Instruments, Inc., has introduced an upgrade to its popular Keithley Test Environment semiconductor test software. KTE Version 5.3 is designed for use with Keithley’s S530 Parametric Test Systems, the company’s fastest, most cost-effective line of process control monitoring solutions to date.
Keithley Instruments Products to Be Distributed by Metric Industrial Oy in Finland, Baltic States
Keithley Instruments, Inc., a world leader in advanced electrical test instruments and systems, has signed an agreement for the distribution of its products in Finland and the Baltic states (Estonia, Latvia, and Lithuania) with Metric Industrial Oy, a Finnish company specializing in distributing components and test equipment for the industrial automation, fiber optic networks, and electronics industries.
Keithley Publishes Low Voltage, Low Resistance Measurements E-Handbook
Keithley Instruments, Inc., a world leader in advanced electrical test instruments and systems, has published an electronic handbook titled “Making Precision Low Voltage and Low Resistance Measurements.” The handbook, which offers instant online access to a wide range of Keithley application notes, white papers, webinars, and many other references, was developed to help readers solve today’s toughest low level measurement challenges.
Keithley Instruments Signs Distribution Agreement with Nortelco Electronics of Sweden
Keithley Instruments, Inc., a world leader in advanced electrical test instruments and systems, has signed a distribution agreement with Nortelco Electronics to handle sales and support of the company’s products in Sweden. Nortelco Electronics is currently establishing a new sales office in Stockholm to handle Keithley and its other distribution clients.
Keithley Publishes Low Voltage, Low Resistance Measurements E-Handbook
Keithley Instruments, Inc., a world leader in advanced electrical test instruments and systems, has published an electronic handbook titled “Making Precision Low Voltage and Low Resistance Measurements.” The handbook, which offers instant online access to a wide range of Keithley application notes, white papers, webinars, and many other references, was developed to help readers solve today’s toughest low level measurement challenges.
Keithley Publishes Online Nanotechnology Seminars on CD
Keithley Instruments has assembled a new collection of its nanotechnology-focused web tutorials and seminars in a convenient CD format. “Characterizing Nano-Materials and Devices with Precision and Confidence” is available free upon request at: http://www.keithley.com/pr/089.
Free Keithley Web-Based Seminar Explores Electrical Characterization of Solar Cells
Keithley Instruments will broadcast a free, web-based seminar titled “Understanding Electrical Characterization of Solar Cells” on Thursday, June 30, 2011. This one-hour seminar will discuss the different measurement techniques that can be used to characterize solar cells and other photovoltaic devices. To register for this event, visit www.keithley.com/events/semconfs/webseminars.
Keithley Whitepaper / Hall effect measurement
Looking in great detail at hall effect measurements in materials characterization.
Keithley Publishes E-Guide About High Performance Source-Measure Solutions
Keithley Instruments, Inc., world leader in advanced electrical test instruments and systems, has published an informative e-guide titled “Cost-effective, high performance sourcing and measurement solutions.”
Optimizing a Switch System for Mixed Signal Testing
Switching systems are often needed to automate and speed up the testing of multiple devices in a production environment, and when making mixed signal measurements during R&D and production. Mixed signal measurements on multiple devices increases the importance of switching systems as a means of achieving high test system throughput. Still, there are a number of potential pitfalls in choosing and configuring the switch hardware and software fo...
Hall Effect Measurement Fundamentals
Learn how to make Hall effect measurements as they relate to semiconductor materials and device characterization.
Keithley Publishes E-Handbook on Precision Low Current, High Resistance Measurements
Keithley Instruments has published an informative e‑handbook titled “Making Precision Low Current and High Resistance Measurements.”
Keithley Publishes E-Handbook on Nanoscale Electrical Measurements
Keithley Instruments, Inc., a world leader in advanced electrical test instruments and systems, has published an informative e-handbook titled “Ensuring the Accuracy of Nanoscale Electrical Measurements.”