Once sample testing is complete, the designer moves on to statistical sample testing. The number of devices tested and the volume generated usually requires the use of a much more automated process. Although there are several vendors of automated power device test systems, such systems are expensive and the scope of the tests they can perform is often limited.

In some cases, when developing new integrated devices designers use the initial data they obtain to provide feedback to the fab, requesting a tweak of some process parameter, the better to establish the particular device characteristic for which they are looking. Once the designer is satisfied the device is ready, he or she moves on to a much more detailed sample testing phase.

When checking Drain Breakdown Voltage (BVDSS) manually, the voltage is slowly increased until a target current is reached. A faster, more efficient way to make this measurement is to source the target current and read the voltage at which the device settles. This requires an instrument that provides both an accurate, fast-acting voltage meter and a voltage clamp.

The recent drive toward greater energy efficiency has created an increasing demand for better high power semiconductor devices such as diodes, FETs, IGBTs and others. New technologies hold the promise of higher performance, including lower ON-state losses, lower OFF-state leakage, faster switching, and reduced loss while switching.

Keithley Instruments has unveiled a economical new offering, the Model 2110 5-1/2-digit Dual-Display Digital Multimeter is optimized for a variety of general-purpose system and bench design applications.

Keithley has introduced three new economical source measurement unit instruments suited for benchtop and R&D applications to its Series 2600B System SourceMeter SMU Instrument line, which now includes new capabilities that enhance productivity and ease of use.

Keithley has previously donated a Model 2440 5A SourceMeter to Oregon State University’s Solar Vehicle Team, helping the electrical engineers of tomorrow characterize photovoltaic devices accurately and efficiently. OSUSVT has been using the instrument in analyzing and troubleshooting mono-crystalline silicon solar modules.

Keithley is pleased to announce that it will be broadcasting a free webinar titled “Understanding Electrical Characterization of Solar Cells” on Thursday, July 26, 2012 at 1:00 PM UTC (9:00 AM EDT) and 2:00 PM EDT (6:00 pm UTC). To register for this event, visit http://www.keithley.info/solarcells.

Keithley today announced that it has published an informative e-guide titled “Ultra-Fast I V Applications for the Model 4225-PMU Ultra-Fast I-V Module.” A free copy is downloadable upon request from Keithley at: http://www.keithley.com/promo/pr/1107.

Techniques For Making Optimal Low Current and High Resistance Measurements - To view the entire webinar go to: http://goo.gl/tKuAX

Keithley Instruments, Inc. will webcast a free, online technical seminar titled “Fundamentals of High Power Semiconductor Device Testing” on Thursday, May 24 at 15:00 CEST. In recent years, there has been a surge of interest in the development of power semiconductor devices to meet the demands of more efficient, higher power end products.

Temperature measurements are integral to a wide variety of test and measurement applications, which makes it easy to understand why temperature is the most commonly measured parameter. Temperature measurements are part and parcel of: Power supply burn-in; Highly accelerated life testing (HALT); Highly accelerated stress testing (HASS); Device temperature profiling; Environmental stress screening; Plant/environment monitoring and control; Automoti...

Keithley Instruments, Inc. continues to enhance the capabilities of its S530 Parametric Test Systems, the semiconductor industry’s most cost-effective solution for high speed production parametric test. Supported by the latest version of Keithley Test Environment software (KTE V5.4), the S530 can now be configured for 48-pin full Kelvin switching and with new integrated options for pulse generation, frequency measurements, and low voltage measu...

The IEEE has named Dr. Rik Pintelon as the recipient of the 2012 IEEE Joseph F. Keithley Award in Instrumentation and Measurement. Pintelon is being recognized for the development of innovative system identification methods for measurement applications. The award, sponsored by Keithley Instruments, Inc., a world leader in advanced electrical test instruments and systems, is presented for outstanding contributions in the field of electrical measur...

Keithley Instruments, Inc., a world leader in advanced electrical test instruments and systems, today introduced the Model 2657A High Power System SourceMeter® instrument. The Model 2657A adds high voltage to the company's Series 2600A System SourceMeter® family of high speed, precision source measurement units. Together, these instruments allow Keithley's customers to characterize an even broader range of power semiconductor devices and materi...

Keithley Instruments, Inc. today introduced the Model 2657A High Power System SourceMeter instrument. The Model 2657A adds high voltage to the company’s Series 2600A System SourceMeter family of high speed, precision source measurement units.

Keithley Instruments, Inc. will broadcast a free, web-based seminar titled “What is an SMU Instrument, and How Do You Decide Which One is Right for Your Application?” on Thursday, February 23, for participants in North America and on Thursday, March 1, for those in Europe. This one-hour seminar will address how source measurement unit (SMU) instruments work, describe key features and capabilities to consider when selecting them, and compare t...

Keithley Instruments, Inc. has published its 2012 Test & Measurement Product Catalog. The catalog, which is provided on a CD, offers details and technical specifications on Keithley’s general-purpose and sensitive sourcing and measurement products, DC switching, and semiconductor test systems and low leakage switch solutions.

Keithley Instruments, Inc. has upgraded the capabilities of its Automated Characterization Suite (ACS) Test Environment. ACS Version 4.4 is designed for use with a number of the company’s instrument and system configurations used mainly for automated device characterization and reliability analysis. It supports a newly enhanced reliability test option (Model ACS-2600-RTM), as well as expanded ultra-fast bias temperature instability (BTI) testin...