Nordson DAGE opens in Korea

Mark Norris, AT-ES Asia Vice President, commented, “This new state-of-the-art demonstration facility allows our customers from all over the Asian region to come and bring their samples for full metrology testing under optimum clean room conditions. In particular, it provides them with the opportunity to use our unique XM8000 wafer X-ray metrology tool for non-destructive measurement of voiding and critical dimensions in specific, and the smallest, wafer bumps and TSVs by using 2D and 3D techniques. The XM8000 sets a new metrology paradigm for the production needs of these new wafer features.”