Search results for "anritsu"
Fading simulation enhances LTE-A signalling tester
Integrated channel fading simulation has been introduced into its 4G LTE-Advanced Signalling Tester, the MD8430A by Anritsu. The new digital baseband fading options convert the MD8430A into a full-featured fading simulator supporting industry standard 3GPP-defined fading profiles.
Cloud-based solution cuts DAS installation costs
SkyBridge Tools is a cloud-based trace judgment solution for tower and in-building Distributed Antenna System (DAS) installations developed by Anritsu. It reduces costs and improves ROI. Serving as a data warehouse for contractors who are installing or modifying equipment for network operators, SkyBridge Tools saves time, reduces rework, and makes timely payment more likely by automating the trace judgment process.
50 & 75Ω VNA calibration kits operate up to 26.5GHz
Expanding its portfolio of general purpose VNA calibration kits, Pasternack has announced 50 and 75Ω versions. The kits offer excellent performance characteristics designed for the fine-tuning and calibration of sensitive test equipment in engineering labs, production environments and quality testing facilities.
Companies unite to update integrated OTA solution
Following the successful launch of world’s first LTE 3CC Carrier Aggregation OTA measurement solution in December last year, Bluetest and Anritsu have integrated the new Anritsu Radio Communication Analyser MT8821C and Bluetest’s recently released 5th generation OTA Reverberation Test System RTS65.
DEMUX modules raise signal quality analyser performance
The MP1800A Signal Quality Analyser from Anritsu has been enhanced by the addition of the MP1861A MUX and MP1862A DEMUX modules. These will expand the functions of the MP1800A 32G BERT to support 56G and 64G BER measurements required for evaluating high-speed serial transmission devices, such as SERDES. When used in conjunction with the MP1800A, the two new modules support a generation of NRZ Data and BER measurements up to 64.2 Gbit/s.
IMD options broaden VNA capabilities
Intermodulation Distortion (IMD) options for the VectorStar platform have been introduced by Anritsu. The options expand the measurement capability of the VNA family to meet the needs of design and production engineers who must conduct highly accurate and efficient IMD measurements on their amplifier designs.
Time-saving VNAs extended to broader range of RF test
The ShockLine family of affordable vector network analysers (VNAs) from Anritsu has been extended with the Performance ShockLine MS46500B series. It lowers cost-of-test and speeds time to market in numerous testing applications up to 8.5GHz, including designing and manufacturing mobile network equipment, mobile devices, automotive cables, high-speed data interconnects and system integration components.
Radio communication analyzer supports LTE-A testing
The MT8821C is a new Radio Communication Analyzer from Anritsu for research and development testing of mobile devices (User Equipment, UE) with the widest capability for supporting LTE-Advanced. The analyzer also operates as a network simulator supporting LTE, W-CDMA/HSPA, GSM/GPRS/EGPRS, TD-SCDMA/HSPA, and CDMA2000 1X/1x EVDO technologies to run RF TRX tests in compliance with the 3GPP and 3GPP2 standards, as well as parametric tests.
Transport network tester options support RFC6349 spec
Important enhancements have been added to Anritsu’s portable MT1000A Network Master Pro and MT1100A Network Master Flex family of all-in-one transport network testers. The enhancements include the support of CPRI/OBSAI and RFC 6349 TCP throughput testing, Optical Transport Network (OTN) multi stage mapping for OTU3/4, a powerful remote operation tool and support of a Video Inspection Probe.
VNA features frequency coverage from 70kHz to 110GHz
The VectorStar ME7838A4 4-port broadband vector network analyser (VNA) system from Anritsu features the world’s widest differential broadband sweep from 70 kHz to 110/125 GHz and utilises the smallest mmWave modules to conduct highly stable and fast measurements when characterising differential devices.