Search results for "transistor"

Engineers in the automotive space are faced with the challenges of delivering inverter designs with increased efficiency, higher drive current and greater immunity to noise, especially in hybrid electric vehicles (HEV) and electric vehicles (EV). To help designers meet these challenges, Fairchild Semiconductor, a leading global supplier of high performance power and mobile products, developed the FAN7171 high-current, high-side gate driver IC and...

The Flexible Display Center at Arizona State University and Universal Display Corporation have announced that they have successfully fabricated the first full-color, flexible active matrix organic light emitting diode (AMOLED) display prototypes using the Center’s bond/de-bond manufacturing process, in combination with Universal Display’s full-color, top-emission phosphorescent OLED technology and materials. The displays also use Universal Di...

Avago Technologies announced that Yaskawa Electric Corporation has selected two of its latest R2Coupler™ isolation products for use in the futuristic Mazda Premacy hydrogen/gas powered hybrid vehicle. Yaskawa, which makes the electronic motor inverter system for the Premacy, is using Avago’s ACPL-782T automotive grade isolation amplifier and ACPL-312T gate drive optocoupler in its electronic motors.

Renesas today announced the availability of its new control IC (part number µPD168891) for automotive light emitting diode (LED) headlights. The main features of the µPD168891 IC are (1) an integrated current-control function for constant-current drive of LEDs as well as a pre-driver function for driving external metal-oxide-semiconductor field-effect transistors (MOSFETs); (2) integrated protection functions essential for automotive applicati...

Infineon Technologies AG and Bombardier Transportation have entered into a strategic partnership in the field of drive electronics for advanced rail vehicles. The agreement envisages the supply of semiconductor components by Infineon to Bombardier in the course of the coming five years. These power semiconductors enable energy-efficient control of electric motors in locomotives, high-speed trains, underground and urban railways. Infineon will ens...

Arrow Electronics has announced that it has signed a definitive agreement pursuant to which Arrow will acquire all of the assets and operations of the RF, Wireless and Power Division of Richardson Electronics, Ltd.

Phidgets Inc. announced that he new version of the 1018 PhidgetInterfaceKit 8/8/8 now has a Digital Input Hardware Filter that eliminates false triggering from electrical noise. The digital input is filtered by a 2-stage filter, rejecting noise of higher frequency than 1Khz. This filter generally eliminates the need to shield the digital input from inductive and capacitive coupling likely to occur in wiring harnesses.

Burkert’s new mxControl multi-parameter controller automates the precise control of process variables within a water treatment system (boiler, cooling or Reverse Osmosis system), by integrating all the control, monitoring, display, and data and event logging functions into one compact, easy- to- configure controller. The mxControl accepts analog inputs from flow, pH, temperature, level, analytical and conductivity sensors, and provides high lev...

Keithley Instruments will broadcast a free, web-based seminar titled “New Methods for Testing FLASH Memory” on Thursday, May 20, 2010. This one-hour presentation will examine new developments, such as multi-level cell (MLC), that are aimed at achieving increased density. The seminar will also explore the continuous advancements that are being made in measurement techniques and capabilities from characterizing a single transistor for developm...

Keithley Instruments, Inc., a world leader in advanced electrical test instruments and systems, will broadcast a free, web-based seminar titled “High Voltage Wafer Level Test - Tips, Tricks, and Pitfalls” on Thursday, April 14, 2011. This one-hour seminar will identify, discuss, and propose solutions for a number of challenges related to high voltage wafer level parametric test.