Unisem Announces Selection of Teradyne J750Ex for Consumer Digital Testing

In addition to its Sunnyvale, California location, Unisem has multiple J750 systems installed in the UK, China and Southeast Asia. The J750Ex instrumentation includes 200MHz digital test capability, enables faster test times and extends functional test coverage for a broader range of low-end SOC devices than the traditional J750 platform. Another key component of the J750, Teradyne IG-XL™ software, reduces program development time for multisite production release and continues to be a benchmark for ATE software. The J750Ex instrumentation can test increasingly complex devices while delivering the high production volume and low cost of test required in the price sensitive consumer device arena. said Jason Zee, Consumer Business Unit manager, Teradyne. The J750 system’s extensive instrument portfolio enables Unisem to serve a broad range of semiconductor test applications including microcontrollers and consumer audio devices. The J750 system offers tremendous value to our customers who need an ATE platform that offers rapid time-to-market and low cost-of-test for semiconductors targeted at the consumer electronics market, said Marita Erickson, general manager, Unisem-Sunnyvale. Adding the availability of J750Ex digital instrumentation extends the range of test coverage we can offer our customers.