Modular metrology solution uses the shadow moiré measurement technique
Microtronic has announced that it has added the Akrometrix TherMoiréAXP to its demo facility in Munich. The AXP has been installed and is available in the Microtronic application lab for demos and test services. The TherMoiré AXP is a modular metrology solution that utilises the shadow moiré measurement technique, combined with automated phase-stepping, to characterise out-of-plane displacement for samples up to 400x400mm.
With time-temperature profiling capability, the TherMoiré AXP captures a complete history of a sample's behaviour during a user-defined thermal profile.
The combination of shadow moiré measurement and dynamic temperature profiling is the foundation of the patented TherMoiré platform. Dynamic profiling is the most effective approach to analyse mechanical behaviour induced by real-world processes and operating environments. Using the TherMoiré AXP, engineers can gain a better understanding of the interactions between materials, packages, substrates and complete assemblies.
The TherMoiré AXP is powered by Akrometrix's Studio 7.2 Software and can be used for a variety of laboratory applications, including Pb-free processing implementation, pre-production mechanical behavior qualification, evaluation of different materials and constructions failure/defect analysis.
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