Test & Measurement

Agilent has introduced a probe kit for making differential time-domain reflectometry (TDR) and time-domain transition (TDT) measurements. TDR/TDT analyses are commonly performed by signal-integrity engineers during the design and validation of high-speed serial links and components. TDR/TDT measurements are also invaluable for maintaining consistent quality in printed circuit board and passive-component manufacturing.

Agilent Technologies has announced that Simplay Labs in Shanghai, China, has selected Agilent's HDMI test solution for source, sink and cable certification at its new test center. This purchase continues the long-term relationship between Simplay Labs and Agilent to further develop devices for HDMI standards.

Aeroflex has announced that its IFF-45TS Avionics Test Set has received official certification from the U.S. Department of Defense International AIMS Program Office. The IFF-45TS test set is now AIMS certified to perform testing and validation on identification, friend or foe (IFF) Mode 4 and 5 transponders and interrogators. In addition, the IFF-45TS will perform testing on DME/TACAN interrogators.

Agilent has introduced an integrated real-time radio frequency emitter geolocation technique using a network of Agilent N6841A RF Sensors. The Agilent N6854A Geolocation server software estimates position of a non-cooperative intermittent or short-duration RF signal using measurements from the sensor network and calculations with time-difference-of-arrival (TDOA) techniques.

Agilent has introduced what it says is the industry's first solution for the WirelessHD compliance test -- the CTS-1000 automated WirelessHD test system -- designed specifically for manufacturers of WirelessHD modules and chipsets for consumer and computing products.

Keithley Instruments has introduced what it says is the test industry’s only cabling solutions capable of handling I-V, C-V, and pulsed I-V signals with a single set of cables (patent pending). The new cabling kits are based on a patent-pending design that speeds and simplifies the process of making DC Current‑Voltage (I‑V), Capacitance‑Voltage (C‑V), and pulsed I‑V testing connections from any modern semiconductor...

Keithley Instruments has introduced a variety of hardware, firmware, and software enhancements to its Model 4200-SCS Semiconductor Characterization System. The Keithley Test Environment Interactive (KTEI) V7.2 upgrade includes nine new solar cell test libraries, an expanded frequency range for the system’s Capacitance-Voltage (C-V) measurement capability, and support for the company’s new nine-slot Model 4200-SCS instrument chassis.

Aeroflex has announced it has added IFF test modes 1, 2 and TACAN as standard features to the IFR 6015 Ramp Test Set, the company’s next generation of avionics test equipment. Compact, lightweight and weatherproof, the IFR 6015 is a battery-powered portable unit designed to test the operation of aviation transponder modes 1, 2, 3A/C/S including European Elementary and Enhanced Surveillance (ELS and EHS), TCAS I, II and Military E-TCAS, TIS and ...

National Instruments simplifies instrument control by offering the NI Instrument Driver Network (IDNet), said to be the industry’s largest source of instrument drivers, and easy-to-use software optimised for instrument control including NI LabVIEW, LabWindows/CVI and Measurement Studio for Microsoft Visual Studio.

Molex has purchased the equipment assets of the Motorola Antenna/EMC Measurement Lab in Aalborg, Denmark. The lab has state-of-the-art antenna and EMC measurement equipment, including anechoic chambers, an EMC chamber and a SAR system. Molex will use the lab for RF research projects to further advance Molex antenna technologies for wireless applications.