Test & Measurement
Verigy Receives Frost & Sullivan 2009 Product Innovation of the Year Award for Flash and DRAM Test Platform
Verigy, a semiconductor test company, has announced it has been awarded the 2009 Product Innovation of the Year Award from Frost & Sullivan for its V6000 tester platform. Introduced in late 2008, the V6000 enables testing of both flash and DRAM memory on the same platform, at breakthrough cost-of-test. The V6000 is versatile and scalable across the entire semiconductor memory test process, including engineering, wafer sort and final test.
Hand-held digital power meters from Aspen
The Bird 5000-XT hand-held digital power meter is redesigned specifically for portability and ease of use in the field. Available in the UK from Aspen Electronics, this digital power meter is ideal for field service technicians and engineers who need to work in tight corners. It is easily attached to a tool belt and can even be operated with one hand.
Keithley Webinar Explores Fundamentals of Semiconductor C-V Testing
Keithley Instruments will broadcast a free, web-based seminar titled “Semiconductor Capacitance-Voltage (C-V) Fundamentals,” which will be presented by Electronic Design magazine. Lee Stauffer, Senior Staff Technologist for Keithley’s Semiconductor Measurements Group will present the webinar and take questions from the audience at the end. The webinar will be broadcast on Tuesday, June 2, at 2:00 p.m. ET (11:00 a.m. PT).
Agilent Offers MATLAB Software with its Sampling Scopes
Agilent Technologies has announced the availability of MATLAB data analysis software with the purchase of Agilent 86100C DCA-J oscilloscopes. Combining Agilent oscilloscopes and MATLAB data analysis software enables engineers to confidently analyze, visualize and filter signals. Users are able to obtain high-quality instrumentation and data-analysis software from a single source, simplifying work processes and saving engineers' time.
Agilent Technologies to Demonstrate Industry-First USB 3.0 Tests with NEC's USB 3.0 Host Controller at Developers Conference
Agilent today will demonstrate its SuperSpeed USB test solution portfolio here at the Developers Conference. This is the industry's first high-performance SuperSpeed USB test fixture coupled with NEC Electronics' USB 3.0 host controller. Agilent will also demonstrate its complete USB 3.0 portfolio, which consists of fully automated transmitter and receiver tests that are key to efficient compliance tests and systematic product characterization of...
Agilent Technologies' EMPro 2009 Improves Integration with Advanced Design System
Agilent has introduced EMPro 2009, the full 3-D electromagnetic design and simulation software that represents the next step in integration with Advanced Design System, the industry's leading RF and microwave design and simulation platform.
Yokogawa launches website for test & measurement products
Yokogawa has launched a dedicated web site for its ranges of test & measurement products. The new site gives full details of the company’s ranges of oscilloscopes, data-acquisition systems, digital power meters, signal sources, and optical and wireless communications test equipment.
Agilent Technologies, Net-O2 Technologies Announce World's First MEF 21 Conformance Test Suite
Agilent Technologies and Net-O2 Technologies has announced what it says is the world's first MEF 21 conformance test suite. This test suite is the result of integrating Net-O2's ATTEST MEF 21 Link OAM protocol conformance test suites (CTSs) into Agilent's N2X multiservices test solution
Free Keithley Web-Based Technical Seminar Explores Electrical Measurements of Photovoltaic/Solar Cell Devices
Keithley Instruments will broadcast a free, web-based seminar titled “Photovoltaic Measurements: Testing the Electrical Properties of Today’s Solar Cells.” It will be broadcast on Wednesday, May 27. This one-hour seminar will provide an overview of the electrical measurements used in photovoltaic device development from basic research to early production testing. To register for this event, visit www.keithley.com/events/semconfs/webseminars...
Power meter complies with latest obligatory EN standards on harmonics testing
The Yokogawa WT3000 digital power analyser equipped with IEC harmonics testing software complies with the latest EN standard on harmonics testing: EN61000-3-2:2006. IEC Standard 61000-4-7 Ed. 2, which is now obligatory as the test method for harmonics testing, specifies that the test instrument must be able to accept current input signals with a crest factor (peak current divided by RMS current) of at least 4 for inputs up to 5 A RMS, 3.5 for inp...