Passives

Murata unveil DMT Series of EDLCs

9th September 2013
Jacqueline Regnier
0

Murata today announced the launch of its DMT series, one of the most reliable electrical double-layer capacitors (EDLC) available on the market today.  The solution offers superior long-term, high temperature reliability (five years at 70C), a maximum operating temperature of 85C, low resistance (130m of high-current, high-output charging and discharging), a nominal capacitance range of 470mF, and an innovative design that enables high voltage handling (4.2V).

Measuring 14x21mm with a thickness of just 3.5mm, the DMT series is ideally suited for applications such as solid state drive (SSD) and communication system backup, power assistance for smart meters, and energy-harvesting devices.

This market’s expansion in recent years has driven the demand for smaller, thinner, and low-resistance capacitors that assure high reliability in the event of power failures.  For example, since an increasing number of end products are being used outdoors (i.e. smart meters), there is a heightened focus on ensuring that solutions have exceptional dependability.  Coupled with more miniaturized specifications, design engineers now require products that are both extremely advanced and eco-friendly.

“To develop solutions with unprecedented functionality and efficiency, Murata is continually pushing the envelope with our research and development efforts,” said Mark Waugh, Business Development Manager, Murata Americas.  “The launch of the DMT line and the class-leading features that it incorporates, exemplifies our ability to deliver leading-edge supercapacitor technology.” 

The basis behind this technology is the result of the company’s collaboration with CAP-XX. In order to meet demand for devices with greater efficiency and functionality, Murata strategically acquired super cap technology from CAP-XX in 2008. Murata’s focus on EDLC research and development, coupled with CAP-XX’s market expertise, drives the advancement of enhanced EDLC design.

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