ITC 2019 provides platform for online test service

4th November 2019

Mick Elliott

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Hardware, software and online test solutions will be presented by Advantest at the 2019 International Test Conference (ITC) in Washington D.C. (November 12-14). It will also supply paper, panel and poster contributions. Advantest is a platinum supporter of ITC and a sponsor of the 50^th Celebration on the evening of November 12 and the Test Technology Technical Council’s (TTTC) Automotive Reliability and Test (ART) Workshop.

Demonstrations include Advantest’s on-demand CloudTesting Service, the latest capabilities of its EVA 100 low-cost analogue/digital IC test solution, a new EVA stimulus tester for automotive current sensors, and a new tool that combines cloud and real-time edge-computing artificial intelligence (AI).

The CloudTesting Service allows users to access various test-method IP selections on Advantest’s website whenever needed. Using this on-demand online service, designers can verify their new silicon at a very low cost with no capital investment, set up their own test environments within a few hours and be ready to test when the device arrives from the fab.

With free tester leasing and minimum maintenance costs, Advantest’s CloudTesting Service allows customers to avoid unplanned expenses.

Advantest’s EVA100 analogue/mixed-signal test solution combines a modular architecture with high-voltage and high-precision analog parametric measurement units, providing the flexibility to conduct various measurements over a broad range of analog and mixed-signal devices.

The versatile, small-footprint EVA100 tester is easy to use for device characterisation through volume production. The scalable architecture can be quickly reconfigured to address a varied product portfolio and achieve lower cost benefits from economies of scale.