Integrated SSD tester features at Flash Memory Summit

6th August 2018

Mick Elliott

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Semiconductor test equipment supplier Advantest will display its new testing capabilities for PCIe Gen 4 solid-state drives (SSDs) using its MPT3000 testers and present two technical papers at the Flash Memory Summit (August 7-9) in Santa Clara, California. Advantest is a gold sponsor of this year’s Summit.

Advantest will exhibit a single-system test solution for developing and manufacturing PCIe Gen 4 SSDs on its MPT3000 platform.

This fully integrated system helps users to accelerate the market introduction of next-generation SSDs by leveraging the proven tester architecture and software from Advantest’s PCIe Gen 3 test solution while also eliminating the need to wait for third-party Gen 4 applications to become widely available.

Advantest technical experts will present two technical papers during the Summit.

In session 201-1 on “Testing/Performance Analysis” beginning at 8:30 a.m. on Wednesday, August 8, Linden Hsu will give a presentation on “Diagnosing SSD Failures During Testing,” which will examine methods for identifying the causes of device failures by collecting, sorting and analysing information from both the DUT and the test equipment.

Then in session 301A-1 on “Testing Issues” beginning at 8:30 a.m. on Thursday, August 9, Sneha Nadig will address “Testing Dual-Port NVMe SSDs,” which will cover devices whose multiple signal paths and ability to connect to two hosts simultaneously are highly valued in the enterprise storage market.