Anaheim venue hosts hardware/online test solutions

1st October 2015

Mick Elliott

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Hardware and online test solutions will be demonstrated by Advantest at the International Test Conference (ITC) in Anaheim, California (Oct 6-8). The company will also present several papers at the associated conference. There will be live demonstrations of Advantest’s on-demand CloudTesting Service and its EVA100 tester for analogue, mixed-signal and sensor ICs.

The CloudTesting Service allows users to access various IP selections whenever needed from Advantest’s website. Using this on-demand online service, designers can verify their new silicon at very low cost with no capital investment.

It allows users to set up their own test environment within a few hours and be ready to test when a device arrives from the fab. With free tester leasing and repairs, Advantest’s CloudTesting Service allows customers to avoid maintenance issues and unplanned expenses.

With its modular architecture and high-voltage, high-precision analogue parametric measurement units, the EVA100 tester has the flexibility to conduct a wide range of measurements over a broad range of analog and mixed-signal devices.

The EVA100’s GUI interface is highly intuitive so users do not need advanced coding skills to quickly develop test programs and rapidly receive feedback on critical design parameters. This minimises the time to release the latest ICs to market.

Advantest presentations include A. Lum hosting a discussion on rapid test development using the EVA100 system.

A paper will also be presented on a new method of measuring alias-free aperture jitter in an ADC output. The authors are T. Yamaguchi and K. Uekusa of Advantest Laboratories, K. Degawa, M. Kawabata and M. Ishida from Advantest and M. Soma of the University of Washington.