Analysis
Imec and Synopsys collaborate on 3D stacked IC development
Synopsys and the Belgian nanoelectronics research center, imec, today announced they have entered into a collaboration to use Synopsys TCAD (Technology Computer-Aided Design) finite-element method tools for characterising and optimising the reliability and electrical performance of through-silicon vias (TSVs). The collaboration will accelerate the development of 3D stacked IC technologies.
Whil“We consider the availability of Synopsys’ silicon-proven finite-element method tools to be an integral part of deploying 3D stacked IC technology. This collaboration will speed up the development of through-silicon via technologies and will in turn facilitate the adoption of 3D stacked ICs in the semiconductor industry,” said Luc Van den hove, president and chief executive officer of imec.
“This collaboration with imec affords us the opportunity to validate Synopsys’ industry- leading TCAD simulation tools for addressing the emerging 3D stacked IC technology. Imec is an ideal collaboration partner for this effort given its excellent research facilities, industry focus and expertise,” said Howard Ko, general manager and senior vice president of the Silicon Engineering Group at Synopsys.