PA design forum tackles modelling, characterisation

20th August 2015

Mick Elliott

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The NI/AWR Design Environment will be featured in the second annual National Instruments-sponsored RF/microwave power amplifier (PA) design forum at European Microwave Week 2015 in Paris on September 9 from 9:30 a.m. to 1:30 p.m. This design forum, entitled, “Device Technologies, Characterisation, Modelling and End-Use Applications,” will focus on the device technologies, characterisation, modelling and end-use applications of RF and microwave power amplifiers (PAs).

The forum aims to foster discussion and provide insight into the latest approaches to device models and parameter extraction measurement techniques and process technologies, as well as modern PA design flow and theory.

Keynote speaker Dr. Steve C. Cripps of Cardiff University will discuss RF PA Design Flow: The Great Debate. Presenting companies are NI, AWR Group, AMPSA, ETL Systems, Modelithics, AMCAD Engineering, Anteverta, Mesuro and ESIEE.

The forum’s agenda is broken into sequential sessions to allow attendees to selectively attend any/all presentations of interest. Agenda topics include: New Capabilities for PA Designers - NI AWR Design Environment V12; Designing Matching Networks for Modern Linear Amplifiers; Practical Broadband Power Amplifier Design Method Using Load-Line, Load-Pull and Real-Frequency Synthesis Techniques; Integration of STAN and the NI AWR Design Environment Framework; A Simple Solution for Fast and Reliable Nonlinear Behavioral Model Extraction; and Measurement and Behavioural Modelling of High Power Transistors.

Also taking place at EuMW2015 is the combined AWR Design Forum (ADF) and European User Group Meeting. ADF is an open forum that brings together customers, partners and microwave/RF engineering professionals to learn, network and collaborate on the design of today's microwave and RF circuits and systems.