Design
Synopsys' DesignWare STAR ECC IP Helps Reduce Embedded Memory Transient Errors
Synopsys announced the availability of the DesignWare STAR ECC (Self-Test and Repair Error Correcting Codes) IP as a part of its DesignWare STAR Memory System® product family. The new DesignWare STAR ECC IP offers a highly automated design implementation and test diagnostic flow that helps system-on-chip (SoC) designers to quickly reduce the number of embedded memory transient errors, such as soft errors, that occur in emerging semiconductor process technologies. Targeted at applications such as automotive, aerospace and high-end computing, the DesignWare STAR ECC IP enables designers to achieve high performance and high field reliability while improving time-to-market.
The As SoCs manufactured in advanced technology nodes become more susceptible to environmental influences, there is an ongoing need to reduce soft error rates, said John Koeter, vice president of marketing for the Solutions Group at Synopsys. The DesignWare STAR ECC IP enables designers to easily select the required fault tolerance level to protect against these transient errors. By using Synopsys' DesignWare STAR ECC IP, designers can achieve their high performance and yield requirements with less risk and improved time-to-market.