Next gen ATPG shortens test pattern generation from days to hours

Additionally, TetraMAX II generates 25% fewer patterns, allowing IC design teams to shorten the time and lower the cost of testing silicon parts or, if required by specific market segments such as automotive, increase the quality of test without impacting test cost. Reuse of production-proven ATPG interfaces ensures risk-free, easy deployment into design and test flows. Users will share their experience with TetraMAX II at the Synopsys Users Group (SNUG) India conference at the Leela Palace Hotel in Bangalore.

TetraMAX II is built on new test generation, fault simulation and diagnosis engines that are extremely fast, exceedingly memory efficient, highly optimised for generating patterns and capable of executing fine-grained multithreading of the ATPG and diagnosis processes. These innovations lead to significantly fewer test patterns and cut ATPG time from days to hours. Unparalleled memory efficiency of TetraMAX II enables utilisation of all server cores regardless of design size, surpassing previous solutions that are limited by high memory usage. The reuse of production proven design modeling and rule checking infrastructure, as well as user and tool interfaces, ensures designers can quickly deploy TetraMAX II risk-free on their most challenging designs.

Moreover, TetraMAX II utilises established links with Synopsys Galaxy Design Platform tools, such as DFTMAX solution, PrimeTime timing analysis and StarRC extraction tool, and other Synopsys tools, including Yield Explorer yield management and Verdi®debug tools, to deliver the highest quality test and the fastest, most productive flows.

"Designers worldwide rely on Synopsys' synthesis-based test solution to achieve the highest test quality on their most challenging designs," said Antun Domic, Executive Vice President and General Manager for Synopsys' Design Group. "TetraMAX II demonstrates our commitment to continually deliver innovative and groundbreaking test technologies and addresses our customers need for faster ATPG and diagnostics as well as reduced silicon test time."