“Welcome to the new dimension of test, the fourth dimension”. As usual, Seica is back to the exhibition with a full range of ATE machines for every need, and a lot of innovative solutions for test and selective soldering, but this time the news are really raising the bar of technology over the top. The “new dimension” of test will be showcased through several different lines of products, all designed around the common core...

Seica today announced that they will be showcasing the following new systems at the SMT Nuremberg Show 2013 - The Compact Line, Pilot V8 Flying Probe, The “power” of a complete ATE, and many others.

Seica have annoucned that they will be exhibiting at the 2012 Autotestcon show, being held on September 11-13 at the Disneyland Resort & Conference Center in Anaheim California. Visit booth 312 to learn more about the industry leading ATE and functional test systems.

Seica, dedicates a specific space to automation, presenting the Pilot V8 Flying Prober with automatic loader, the innovative in-circuit and functional line tester, Compact SL, and the model Top-bottom of Firefly Laser Selective Soldering. In addition, it will be possible to view the RTE-200 Boundary scan system, a combination of Analog test and Boundary scan performance.

Seica, Inc will be an exhibitor at the 2011 SMTA International Electronics Exhibition in Fort Worth Texas on October 18-19th. Visit us in booth # 403 to see that latest advances on our laser selective soldering systems.

Seica Inc. recently announced that Zero Defects International (ZDI) has been chosen the North American sales agent for its line of bare board flying probers. David Sigillo, General Manager of Seica Inc. commented, Seica has been working with ZDI since 2001; they have shown and demonstrated successful sales in this market place in the western region. Along with their success in promoting Seica's other products in their local territory and with o...

Seica, Inc has just introduced Flying IC Thermal Detection Units on its line of Aerial flying probers. Two IC Thermal Detection Units, are positioned on each side of the unit under test to detect thermal parameters of ICs under power. The purpose is to compare temperatures of “known good” boards to “suspect” boards and indict bad components in the depot repair environment.