Transmitter test solution targets mobile storage devices

The mobile industry is moving toward smaller and faster devices that require faster communication between chips over interfaces such as SSIC and need faster access to storage devices over interfaces such as UFS/MIPI UniPro.

This drives the need for higher data rates, higher throughput, modern design implementations and the need for sophisticated test and measurement tools. Automated serial test solutions such as what Tektronix is now offering for MIPI M-PHY 3.1 allow engineers to complete the full set of tests in significantly less time while improving consistency.

The automated solution supports advanced analysis, debugging and characterisation of devices while allowing designers to test in compliance mode as well as user-defined mode.

“Last year we introduced comprehensive test support for M-PHY 3.1, giving our customers the tools they needed to design cutting edge mobile devices with higher performance and improved efficiency,” said Brian Reich, general manager, Performance Oscilloscopes, Tektronix. “Now we are taking our test solution to the next level by giving our customers the advantage of full automation which in turn will help them to bring even higher performing products to market in less time.” 

The M-PHY TX automated solutions provide support for 100 percent of tests as per M-PHY 3.1 and CTS 3.1 using the TekExpress 4.0 framework, a state-of-the-art tool designed for automation. The backend engine of automation is based on Iron Python which uses socket based programming and .Net remoting.

Socket-based scripting interface is a de-facto standard that allows engineers to integrate Tektronix automated solution into their automation environments. 

Testing M-PHY transmitters running in high-speed mode requires a scope and probe system with rise time 3X faster than the signal rise time, sensitivity of 200 mV_FS, minimal added noise (<1 or 2 mV_rms), and high return loss as specified in the M-PHY standard.

Tektronix DPO70000SX and MSO/DPO 70000DX oscilloscopes and P7600 Series TriMode probes are the only measurement system available that can meet these requirements while also providing convenient and consistent bus termination for HS measurements with low noise and high sensitivity.

Along with the automated TX solution, Tektronix also announced its fully automated BERTScope-based M-PHY RX solution. The automation solution is provided by Tektronix partner Granite River Labs. Auto calibration along with measurement support for HS and PWM Mode is supported as per M-PHY 3.1 and CTS 3.1. Auto calibration for high speed gears reduces the complexity of setup, saves time, and enables users to test devices faster. Margin testing for high speed gears allows designers to validate and stress their devices to maximum potential resulting in competitive technical specifications for their products.