Test system streamlines chip & sensor production

6th November 2015

Mick Elliott

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Datasheet

The latest model of its EVA100 measurement system, the high-throughput EVA100 Production Model designed for volume production of sensors, low-pin-count analogue ICs and mixed-signal ICs has been introduced by Advantest. Fully compatible with the initial EVA100 system introduced last year, the new Production Model allows users to establish a standardised measurement environment from design evaluation through production, dramatically improving their products’ time to market.

Booming markets for IoT-capable products, automotive electronics and smart appliances have increased the demand for high-performance analogue ICs, mixed-signal ICs and sensors. Streamlining production times for these devices is critical, but many chipmakers unnecessarily expend valuable time and resources correlating test data because they use an assortment of measurement systems for design and production, each with varying performance levels and incompatible programming languages. Advantest’s versatile EVA100 Production Model system offers a solution to these issues.

The EVA100 platform uses the same test sequences for both design and production measurements and has an intuitive GUI so no complicated programming language is needed. In addition, up to four of the testing units can be clustered to achieve the capacity needed for high-volume production testing. These features simplify operators’ duties, increase throughput and reduce product lead times.

All essential test functions including analogue-voltage and current-source testing are incorporated in the compact EVA100 Production Model.

It contains a fast 100Mb/s pattern generator, digital I/O capability, an AWG and a 2Gb/s oscilloscope for sampling. In addition, serial buses facilitate board inspections and trimming for sensors. All measurement channels are precisely synchronised to ensure reliable, repeatable results for better yield.