Test & Measurement

Tektronix Introduces Industry’s First Test Tools for MIPI M-PHY Debug and Validation

28th September 2010
ES Admin
0
Tektronix today introduced the industry’s first testing tools for the MIPI ® Alliance M-PHY standard, allowing customers to immediately get started with performance verification and debug for this important new specification using Tektronix DPO/DSA/MSO70000B Series oscilloscopes.
The announcement was made in conjunction with the MIPI Alliance All-Members meeting taking place this week in Athens, Greece. The M-PHY specification is an essential part of the MIPI Alliance’s vision for more efficient high-speed interfaces on mobile devices. Compared to the current D-PHY specification, M-PHY supports faster chip-to-chip connections while addressing EMI and power dissipation concerns. By moving quickly to offer M-PHY testing tools, Tektronix is stepping up to help ensure rapid delivery of next-generation mobile devices incorporating M-PHY at the physical layer.

As an active MIPI contributor, Tektronix brings its test and measurement knowledge to the organization, spurring the adoption of D-PHY and M-PHY specifications,” said Joel Huloux, chairman of the MIPI Alliance. Tektronix is aiding the adoption of the new M-PHY interface by giving designers the testing tools they need to ensure signal integrity and verify performance of increasingly complex designs.

Based on the newly ratified MIPI Alliance M-PHY specification, thenew Tektronix M-PHY test offering includes a setup library for the popular DPOJET jitter analysis software and methods of implementation (MOI) developed in the close cooperation with UNH-IOL. The solution also includes probing and protocol support from Tektronix partner, The Moving Pixel Company, as well as M-PHY DigRF(SM)v4 decode and verification.

“Tektronix has been supportive of UNH-IOL's collaborative efforts within the MIPI industry to foster correlation and consistency of physical layer measurement methodologies,” said Andy Baldman, senior technical staff, R&D, University of New Hampshire Inter Operability Lab (UNH-IOL).

“With data rates up to 6 Gbps and greater versatility and sophistication, M-PHY requires dedicated tools that can help designers verify performance and interoperability and efficiently debug problems,” said Scott Silver, president, The Moving Pixel Company. “Working together with Tektronix, our tool supports the capabilities users need now to acquire M-PHY traffic with 8b-10b decode, form packets and disassemble for analysis on Tektronix Oscilloscopes. Powerful search and filter commands help users zero in on exactly the details desired.”

The Moving Pixel Company also offers the P335 M-PHY probe for PG3A with up to 6 Gbps across four lanes and adjustable voltage on a channel-by-channel basis in real time. The probe is designed for use with Tektronix DPO/DSA/MSO70000B Series oscilloscopes.

“We see M-PHY as an extremely important new high-speed serial interface for the mobile device industry,” said Dave Slack, marketing manager, Technology Solutions Group, Tektronix. “As demonstrated by our delivery of many other serial standard testing tools for USB3.0 and SATA 6GB, we are confident that by delivering the industry’s first set of M-PHY testing tools and our active involvement with the MIPI Alliance, we will meet the needs of M-PHY designers looking for signal testing guidance at these high speeds. We are committed to maintaining our leadership in this area over the long term.”

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