70GHz oscilloscope takes centre stage at ECOC

12th July 2015

Tektronix

Mick Elliott

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Datasheet

A wide range of optical test and measurement products and solutions will be showcased by Tektronix at ECOC 2015 in Valencia (September 28-30). A highlight of the stand will be the DPO70000SX 70GHz ATI Performance Oscilloscope. The new oscilloscope incorporates a range of innovations that enable it to more effectively meet the current and future needs of engineers and scientists developing high-speed coherent optical systems or performing leading-edge research.

The AWG70000 Series offers bandwidth on demand by generating wide bandwidth signals at baseband, IF and RF frequencies up to 20GHz, with greater than -80 dBc dynamic range. With up to 16 G samples of waveform memory, it can generate unique signals that are long enough to simulate real world environments or make complex optical modulations such as PAM 4, making it the most flexible wideband signal generation product available today.

Also on parade is the new OM4245 45 GHz Optical Modulation Analyser (OMA) capable of supporting the latest 100G and next-gen 400G communications standards. With support for single-carrier or multi-carrier systems, the analyser is tightly integrated with the Tektronix DPO70000SX 70 GHz ATI Performance Oscilloscope.

The analyser is capable of dual-polarisation coherent optical analysis up to 80 GBaud. It offers built-in, narrow linewidth lasers and supports the Tektronix OM-Series User Interface (OUI).

Along with proven ease-of-use for typical analysis applications, the Tektronix OUI also provides the flexibility and access to the MATLAB computational engine researchers need for more advanced coherent optical analysis.

This provides a robust, time-saving, and customisable platform for conducting experiments in coherent modulation algorithms.

A new series of high-speed pattern generators and bit error detectors to support optical and serial data communications testing on signals as fast as 40 Gb/s. The new 40 Gb/s PPG4001 pattern generator and PED4000 Series error detectors feature very high signal quality and jitter stress capabilities ideal for SERDES, component, and optical module testing.

The PPG3000 Series pattern generators and PED3000 Series error detectors feature multi-channel pattern generation and error detection with channel-specific data programming, jitter insertion, and BER analysis ideal for critical margin testing on standards like 100G Ethernet, which require up to 4 channels.

The 80C15C, 32GHz, single/multi-mode, broad wavelength optical sampling head, the latest addition to the extensive DSA8300 Digital Sampling Oscilloscope platform, offering a complete high-speed PHY Layer testing platform for data communications from 155Mb/sec to 100G.