Test & Measurement
Tektronix and National Instruments to Unveil Joint Product Initiative at NIWeek
Tektronix and National Instruments today announced that the two companies have extended their more than 20-year relationship by unveiling plans to co-innovate on new products that will improve productivity and lower costs for engineers and scientists working in design verification, manufacturing test, scientific research, and embedded test. The two companies will unveil specific details at NIWeek 2009 scheduled for Aug. 4–6 in Austin, Texas.
Over“This collaboration brings together two leading brands with one goal of enabling our joint customers to innovate and bring products to market faster,” said Martyn Etherington, Vice President of Marketing for Tektronix.
“Both National Instruments and Tektronix serve a very large base of customers, and universally, those customers are telling us they want new approaches for optimizing their automated test systems,” said Eric Starkloff, Vice President of Product Marketing for Test at National Instruments. “By expanding our cooperation with Tektronix, we will be creating new offerings to provide engineers with greater design-to-manufacturing productivity, reduced test times, and a lower cost of test.”
For more than 20 years, Tektronix and National Instruments have collaborated on a series of initiatives focused on ensuring strong integration and interoperability between the companies’ respective products. In 2003, the companies worked together to increase the integration of LabVIEW and Tektronix instruments by providing LabVIEW on Tektronix open WindowsTM oscilloscopes. In 2006, they introduced LabVIEW SignalExpress Tektronix Edition to deliver the industry’s best PC to instrument connectivity. Also, in 2006, Tektronix released TekExpress, which uses NI TestStand test management software as its execution engine, to help engineers develop and deploy automated serial data standards compliance test routines.