Tektronix 2010 US Seminar Tour Features Hands-On Training with Cutting-Edge Oscilloscopes

By attending one of the action-packed seminars, design engineers and educators will have the opportunity to perform hands-on digital debug and serial data measurement using the latest Tektronix mixed signal oscilloscopes (MSO ). Through the course of the day, attendees will learn how to discover problems in seconds, capture events of interest the first time they occur, search entire records instantly, and analyze designs fast and efficiently. Attendees who successfully complete the session will receive a certification.

“As electronics products combine more performance and functionality, today’s electronic designers are increasingly required to understand, develop, build and troubleshoot a wide variety of signal and communications paths as part of a complex embedded system,” said Gina Bonini, technical marketing manager, Embedded Systems, Tektronix. “Through the Power2Solve Seminar Tour we are providing engineers with valuable insight into how to tackle these critical debug and testing challenges.”

Throughout the tour, Tektronix and partner experts will be sharing the latest techniques with specific tutorials focused on the following:

* Power Analysis – Attendees will learn how to validate and characterize a Switch-Mode-Power-Supply (SMPS ) that requires measuring switching loss and magnetic power loss to determine the efficiency of the SMPS , and measuring power quality and line harmonics to understand the impact of the SMPS on the power line.
* Debugging Digital Designs – The mixed signal oscilloscope will be used to pinpoint problems by analyzing both the analog and digital representations of signals.
* Serial Data Debug – This hands-on session will highlight different serial bus standards including I2C, SPI , CAN and USB, and use the oscilloscope to decode, capture and search specific messages, characterize system timing, trace data flow through a system and perform in depth analysis of network performance.
* Characterization & Jitter Analysis – This session will provide insight into signal integrity-related problems in digital systems, and describe their causes, characteristics, effects, and solutions. It will further give an introduction to measurement tools and techniques that include jitter and eye diagram measurements.

Seminar Series Schedule and Registration

The free eight city seminar tour will make the following stops. Sessions run 8:30a.m.-5:00p.m.with lunch included:

* Boston, MA, 9/23/10 – together with ESC Boston, booth 518
* Toronto , ON, 9/30/10
* Montreal , QC, 10/4/10
* Minneapolis , MN, 10/12/10
* LongIsland , NY,10/19/10
* Baltimore , MD.10/21/10
* Atlanta,GA, 10/26/10
* Melbourne, FL,10/28/10