SoC test system offers high performance & scalability

17th August 2015

Barney Scott

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DA-Integrated has installed a V93000 Smart Scale SoC test system from Advantest. DA-Integrated’s selection of the V93000 Smart Scale system is based on the tester’s high performance and scalability, its widespread use at outsourced semiconductor assembly and test foundries and its compatibility with the previous P1000 test system, legacy equipment from Advantest’s 2011 acquisition of ATE supplier Verigy.

“Our offering is unique in the world of test development service providers,” said Scott Bulbrook, Vice President of Engineering, DA-Integrated. “As we design and implement test access and custom BIST (Built-In Self-Test) circuits for our customers’ advanced node SoC devices, targeting the V93000 Smart Scale for production test is a great fit. Our seamless integration of verification environments into ATE test programmes is supported nicely by Advantest’s SmarTest Software.”

“We have been in partnership with DA-Integrated for several years now, successfully providing semiconductor manufacturers with a proven path from engineering development to high volume production,” said Hans-Juergen Wagner, Senior Vice President, SoC Product Group, Advantest Corporation. “This repeat order from DA-Integrated further validates the advanced performance capabilities of our V93000 platform, and when coupled with DA-Integrated’s comprehensive IC design and test development services, the solution offers customers accelerated time to market and high fault coverage at the lowest possible cost of test.”