New GOEPEL Gang Tester Provides Significant Increase In Throughput

Thanks to the TAP interfaces’ programmability (voltage, delay, protocol, etc.) and the TAP-to-UUT assignments’ individual configurability, the system can be flexibly customized to fit nearly any environment and application.



“Our OEM, ODM, and EMS customers show constantly growing interest in solutions for high-speed programming of Flash through processor debug interface or with an FPGA-embedded programmer in order to increase throughput. This new addition to our SCANFLEX hardware portfolio additionally ensures the utilization of dynamic tests based on processor emulation in production lines or stress tests in climatic chambers“, says Thomas Wenzel, Managing Director of GOEPEL electronic’s Boundary Scan Division. “The detection of latent defects in particular in HASS/HALT procedures becomes more and more important for many test and production scenarios. Hence, our SFX-TAP16-G-RM is a logical consequence in providing new technologies for maximum fault coverage.”



About SFX-TAP16/G-RM:



The SFX-TAP16/G-RM, available as rack mount version in 19’’ technology (1U), provides 16 parallel TAPs. Its architecture supports all modern Embedded System Access technologies, including boundary scan, processor emulation, and chip-embedded instrumentation, enabling the basic paradigm change for test and programming methods without mechanical probe access (non-intrusive). This new SCANFLEX module was developed specifically for Gang applications, whereby various test and programming strategies can be freely combined.



The new transceiver can be flexibly adapted to the UUT characteristics; its bandwidth reaches from concurrent test/programming of 16 UUTs with a single TAP to two UUT with eight TAP each. In addition, the TAPs can be individually programmed in many parameters.