Serial standards testing enhanced on oscilloscopes

27th May 2016

Tektronix

Mick Elliott

0 0

Datasheet

Support for serial bus standards testing has been added to the Tektronix DPO70000SX family of ultra-high performance oscilloscopes. Featuring patented Asynchronous Time Interleaving (ATI) signal acquisition technology, the DPO70000SX platform offers excellent signal fidelity and performance coupled with a scalable architecture that offers “room to grow” as signal speeds continue to increase.

As engineering teams prepare for next generation standards in the rapidly growing cloud computing and mobile segments, they need a measurement platform with extremely consistent and precise measurement of high data rate signaling schemes. To meet this need, Tektronix is enabling serial bus test support for 4th generation standards including USB3.1, Thunderbolt over USB Type-C, PCIe Gen4 and DDR4 on the DPO70000SX Series.

This new oscilloscope family offers signal fidelity enabling precise margin analysis on 4th generation serial data rates beyond 10Gb/sec.

In addition, Tektronix is bringing its broad portfolio of applications solutions to the DPO70000SX family.

This portfolio spans over 50 solutions for PHY layer compliance testing, characterisation and debugging in enterprise, data communications, mobile and display segments.

The solutions for both 3rd and 4th generation standards offer such capabilities as automated test set-up and execution, built-in reporting options, deep analysis and more.

“As enterprise computing moves from 3rd generation to 4th generation serial standards, our customers need an oscilloscope with the accuracy, support and scalability to manage the transition seamlessly,” said Brian Reich, general manager, Performance Oscilloscopes, Tektronix. “Starting with 23 or 33GHz models, the DPO70000SX’s scalable architecture provides ‘room to grow’ so engineers can preserve their test investment when the time comes to test next-generation standards that need bandwidth at 50GHz and beyond.”