Probe kit aids EMC identification issues

The shielded probes have built-in ferrites and insulated rubber handles to insure that measurements are insensitive to the human hand.   

The H- or E-field probes are useful for detecting radiated emissions when placed near potential sources of electromagnetic radiation, and can help locate and identify interference issues in electronic assemblies and PCBs.  Scanning the probe over the surface of a PCB assembly or housing quickly identifies locations which emit electromagnetic radiation. 

The probes act as wide bandwidth antennas, picking up radiated emissions from components, PCB traces, housing openings, or gaps - and from any other parts that could be emitting unwanted RF signals. The probes are usually connected to a spectrum analyser but may also be used (less effectively) with the FFT capability of a digital oscilloscope. By changing to a probe with smaller size, the origination of the emissions can be further narrowed down.  

The included USB-5V-powered TBWA2 Wideband Amplifier, housed in a compact metal box (1.9" x 2.6" x 1") provides either 20dB or 40dB amplification (depending on model) with a flat response from 10MHz to 3GHz, increasing the sensitivity of near-field probe measurements when attached to a spectrum analyser. 

Applications include: radiated EMC measurements,  contactless (load free) relative measurement of RF signal chains, contactless (load free) relative measurement of oscillators, modulators, RF immunity testing (by feeding a RF signal into the probe and radiating it into potentially susceptible circuit sections), non-invasive measurement of RF building blocks such as modulators or oscillators, etc.