Rohde & Schwarz products redefine network analysis with wider dynamic range, short measurement times and superior ease of use

The R&S ZNB, the more powerful of the two instruments, provides development labs and production lines with performance characteristics previously found only in high-end analyzers. The R&S ZNB covers the frequency range from 9 kHz to 4.5 GHz or 8.5 GHz and is available both in two-port and four-port models. Its wide dynamic range of 140 dB, low trace noise of 0.004 dB (RMS) and high output power of up to +13 dBm, which can be adjusted electronically in a range of 90 dB, provide fast and accurate measurements. This ensures high throughput in production. The R&S ZNB’s magnitude and phase drift are very low, resulting in excellent temperature and long-term stability. This makes it possible to perform precise measurements without recalibration over an extended period of time.


Thanks to its outstanding characteristics, the R&S ZNB is ideally suited for measurements on high-blocking filters or amplifiers that must be manually adjusted on high-volume production lines where speed and efficiency are critical. The large touchscreen is especially useful in this application. The network analyzer can also be used to characterize duplex filters, multiport DUTs, mixers or differential SAW filters for transmitters or mobile terminals.


The R&S ZNC with a frequency range from 9 kHz to 3 GHz is a cost-efficient alternative for users who do not have such high requirements regarding dynamic range and functional scope. The R&S ZNC is available with two test ports and offers a sweep time of 11 ms with 401 points and a dynamic range of up to 130 dB. Its primary use is for testing passive RF components such as filters or cables.


The large touchscreen makes configuring, measuring and analyzing with the R&S ZNB and the R&S ZNC exceptionally easy. Instead of using submenus or nested menus, all context-based control elements are directly available on the soft panel. As a result, all instrument functions are accessible in three operating steps or fewer. Simply by touching the screen, users can create measurement windows, shift traces, set markers, adjust scales and zoom in and out for detailed analyses. Different instrument setups can be clearly arranged on individual tabs and called up instantaneously, allowing DUTs such as amplifiers or RF modules to be characterized even more efficiently. The user interface and online help are available in English as well as Chinese, Japanese, French and Russian.