Test & Measurement

PXI oscilloscope delivers 100Vpp maximum input range at 1GS/s

13th November 2016
Mick Elliott
0

The PXIe-5164 oscilloscope just released by NI is built on the open, modular PXI architecture, and includes a user-programmable FPGA to help aerospace/defense, semiconductor and research/physics applications that require high-voltage measurements and high levels of amplitude accuracy.

Steve Warntjes, vice president of R&D at NI said, “Our new PXIe-5164 oscilloscope can make some measurements that box instruments today just can’t handle. If you want to measure a high-voltage signal of up to 100Vpp at up to 1GS/s, you can now use the same instrument to see small signal details that would normally be hidden by the noise of the instrument thanks to the 14-bit ADC.”  

The PXIe-5164 features two 14-bit channels sampled at 1GS/s with 400MHz bandwidth, two Category II-rated channels with voltage input range to 100Vpp with programmable offsets allowing measurements up to ± 250V and up to 34 channels to build parallel, high-channel-count systems in a compact form factor in a single PXI chassis.

It also offers a 3.2GB/s streaming data rate enabled by 8 lanes of PCI Express Gen 2 bus communication and a Xilinx Kintex-7 410 FPGA to create custom IP, including filtering or triggering, programmed through LabVIEW. 

PXI oscilloscopes deliver the ease of use expected from a box oscilloscope. Engineers can use the interactive soft front panels in NI-SCOPE software to make basic measurements, debug automated applications or view the scope data while the test program runs.

The driver includes help files, documentation and ready-to-run example programs to assist in test code development, and includes a programming interface that works with a variety of development environments such as C, Microsoft .NET and LabVIEW system design software.

Engineers can also use PXI oscilloscopes with TestStand test management software, which simplifies the creation and deployment of test systems in the lab or on the production floor. 

 

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